SURFACE INSPECTION SYSTEM, APPARATUS, AND METHOD

• US 20190293552A1
• Filed: 03/21/2018
• Published: 09/26/2019
• Est. Priority Date: 03/21/2018
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Georgeson, Gary E., McIver, Keith L., Rutherford, Paul S.
• Granted Patent: US 10,976,244 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 21/8806 Specially adapted optical and illumination features
• CPC Class Codes: G01N 21/95 characterised by the material or shape of the object to be examined G01N21/89 - G01N21/91, G01N21/94 take precedence
• CPC Class Codes: G01N 2201/061 Sources

Abstract

An apparatus for surface inspection comprises a terahertz emitter, a detector, and a computing device. The terahertz emitter is oriented to emit energy toward a surface having a surface layer disposed on the surface in a proximity of a surface feature. The detector is positioned to receive the energy from the terahertz emitter that is reflected by the surface. The computing device is in signal communication with the detector and is configured to detect the surface feature using a signal from the detector.

Claims

1. An apparatus for surface inspection, the apparatus comprising:

a terahertz emitter oriented to emit energy toward a surface having a surface layer disposed on the surface in proximity of a surface feature coupled to the surface;

a detector positioned to receive terahertz energy from the terahertz emitter that is reflected by the surface; and

a computing device in signal receiving communication with the detector, wherein the computing device is configured to detect the surface feature using a signal from the detector.

2. The apparatus of claim 1, wherein the computing device is configured to identify a location of the surface feature using the signal from the detector.

3. The apparatus of claim 1, wherein the computing device is configured to identify a degradation of the surface proximal the surface feature using the signal from the detector.

4. The apparatus of claim 1, wherein the signal from the detector identifies at least one of:

a location at which terahertz energy is received by the detector;

a time of flight of the terahertz energy from the terahertz emitter to the detector;

a change in frequency of the terahertz energy;

an attenuation in the terahertz energy; and

a directional change in the terahertz energy.

5. The apparatus of claim 1, wherein the terahertz emitter comprises a single emitter.

6. The apparatus of claim 1, wherein the terahertz emitter comprises at least two emitters.

7. The apparatus of claim 1, wherein the surface comprises a metallic material.

8. The apparatus of claim 1, wherein the surface feature comprises a fastener.

9. The apparatus of claim 1, wherein the computing device is configured to determine a state of the surface proximal the surface feature.

10. The apparatus of claim 1, wherein at least one of the terahertz emitter and the detector is coupled to an end effector of a robotic arm.

11. The apparatus of claim 1, where at least one of the terahertz emitter and the detector is coupled to a hand-operated system.

12. A system for surface inspection, the system comprising:

a robotic arm;

an end effector coupled to a process end of the robotic arm;

an apparatus for surface inspection coupled to the end effector, wherein the apparatus comprises;

a terahertz emitter oriented to emit terahertz energy toward a surface having a surface layer disposed on the surface in a proximity of a surface feature; and

a detector positioned to receive the terahertz energy from the terahertz emitter that is reflected by the surface; and

a computing device in signal communication with the detector, wherein the computing device is configured to detect the surface feature using a signal from the detector.

13. The system of claim 12, wherein the computing device is configured to align the apparatus for surface inspection with the surface feature.

14. The system of claim 12, wherein the end effector is configured to rotate the apparatus for surface inspection during an inspection of the surface.

15. The system of claim 12, further comprising a tool coupled to the end effector to perform an operation at the surface.

16. The system of claim 12, wherein the surface layer comprises at least one of a sealant, a paint, and an adhesive.

17. The system of claim 12, wherein the robotic arm is attached to an independently positionable mobile device.

18. A method for surface inspection, the method comprising:

positioning an apparatus for surface inspection relative to a surface having a surface layer disposed on the surface;

emitting a terahertz energy to impinge on the surface through the surface layer;

detecting terahertz energy reflected from the surface; and

detecting a surface feature of the surface through the surface layer based on an analysis of the reflected terahertz energy.

19. The method of claim 18, further comprising:

repositioning the apparatus for surface inspection to align with the surface feature; and

detecting a state of the surface proximal the surface feature.

20. The method of claim 18, wherein the surface feature comprises a fastener.

21. The method of claim 18, further comprising:

positioning a tool at the surface feature; and

performing an operation with the tool.