TEST DEVICE AND METHOD
First Claim
1. A test device, comprising:
- a first connection interface, coupled to a device under test (DUT) and obtaining power information from the DUT according to a first instruction;
a storage device, storing the power information;
a processor, coupled to the first connection interface and storage device, when the first connection interface is coupled to the DUT, sending the first instruction to the first connection interface, receiving the power information from the first connection interface, and storing the power information in the storage device;
a second connection interface, coupled to an external controlling system, sending the power information to the external controlling system and receiving a test instruction from the external controlling system to test the DUT; and
a first controller, coupled to the first connection interface and the processor, and converting a first communication format which is applicable to the first connection interface to a second communication format which is applicable to the processor.
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Abstract
A test device and a method are provided in the invention. The test device includes a first connection interface, a storage device, a processor and a second connection interface. The first connection interface is coupled to a device under test (DUT) and obtains power information from the DUT according to a first instruction.
The storage device stores the power information. The processor is coupled to the first connection interface and storage device, when the first connection interface is coupled to the DUT, sends the first instruction to the first connection interface, receives the power information from the first connection interface, and stores the power information in the storage device. The second connection interface is coupled to an external controlling system, sends the power information to the external controlling system and receives a test instruction from the external controlling system to test the DUT.
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Citations
13 Claims
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1. A test device, comprising:
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a first connection interface, coupled to a device under test (DUT) and obtaining power information from the DUT according to a first instruction; a storage device, storing the power information; a processor, coupled to the first connection interface and storage device, when the first connection interface is coupled to the DUT, sending the first instruction to the first connection interface, receiving the power information from the first connection interface, and storing the power information in the storage device; a second connection interface, coupled to an external controlling system, sending the power information to the external controlling system and receiving a test instruction from the external controlling system to test the DUT; and a first controller, coupled to the first connection interface and the processor, and converting a first communication format which is applicable to the first connection interface to a second communication format which is applicable to the processor. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A test method, applied in a test device, comprising:
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when a first connection interface of the test device is coupled to a device under test (DUT), sending a first instruction to the DUT through the first connection interface to obtain power information from the DUT, wherein a first controller of the test device converts a first communication format which is applicable to the first connection interface to a second communication format which is applicable to a processor of the test device; storing the power information in a storage device, wherein the storage device is externally connected to the processor; when an external controlling system sends a serial instruction to request the power information of the DUT, sending the power information to the external controlling system through a second connection interface of the test device, wherein the processor converts the second communication format which is applicable to the processor to a third communication format which is applicable to the second connection interface; and receiving a test instruction from the external controlling system through the second connection interface to test the DUT. - View Dependent Claims (9, 10, 11, 12, 13)
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Specification