Selecting a Precision Level for Executing a Workload in an Electronic Device

• US 20190310864A1
• Filed: 04/09/2018
• Published: 10/10/2019
• Est. Priority Date: 04/09/2018
• Status: Active Grant

• Current Assignee: Advanced Micro Devices, Inc.
• Original Assignee: Advanced Micro Devices, Inc.
• Inventors: Gutierrez, Anthony T., Blagodurov, Sergey, Moe, Scott A., Zhang, Xianwei, Yin, Jieming, Sinclair, Matthew D.
• Granted Patent: US 11,150,899 B2
• Time in Patent Office: Days
• CPC Class Codes: G06F 8/71 Version control security arrangements therefor G06F21/57; Configuration management
• CPC Class Codes: G06F 9/30014 with variable precision
• CPC Class Codes: G06N 3/063 using electronic means
• CPC Class Codes: G06N 3/08 Learning methods

Abstract

An electronic device includes a controller functional block and a computational functional block. During operation, while the computational functional block executes a test portion of a workload at at least one precision level, the controller functional block monitors a behavior of the computational functional block. Based on the behavior of the computational functional block while executing the test portion of the workload at the at least one precision level, the controller functional block selects a given precision level from among a set of two or more precision levels at which the computational functional block is to execute a remaining portion of the workload. The controller functional block then configures the computational block to execute the remaining portion of the workload at the given precision level.

Claims

1. An electronic device, comprising:

a hardware controller functional block; and

a hardware computational functional block;

wherein the controller functional block is configured to;

while the computational functional block executes a test portion of a workload at at least one precision level, monitor a behavior of the computational functional block;

based on the behavior of the computational functional block while executing the test portion of the workload at the at least one precision level, select a given precision level from among a set of two or more precision levels at which the computational functional block is to execute a remaining portion of the workload; and

configure the computational block to execute the remaining portion of the workload at the given precision level.

2. The electronic device of claim 1, wherein selecting the given precision level comprises:

when the behavior of the computational functional block while the computational functional block executes a test portion of a workload at the at least one precision level exceeds at least one threshold, selecting the given precision level; and

otherwise selecting a different precision level from among the set of two or more precision levels.

3. The electronic device of claim 2, wherein:

executing the test portion of the workload at the at least one precision level comprises executing the test portion of the workload at each of a higher-precision precision level and a lower-precision precision level; and

selecting the given precision level comprises;

when a difference in the behavior of the computational functional block when executing the test portion of the workload at the higher-precision precision level and the lower-precision precision level exceeds a threshold, selecting the higher-precision precision level as the given precision level; and

otherwise, selecting the lower-precision precision level as the given precision level.

4. The electronic device of claim 2, wherein:

the behavior of the computational functional block comprises a number of iterations performed when executing the test portion of the workload; and

the threshold is a specified value of a number of iterations.

5. The electronic device of claim 2, wherein:

the behavior of the computational functional block comprises at least one result generated when executing the test portion of the workload; and

the threshold is a specified value of the at least one result.

6. The electronic device of claim 2, wherein:

the behavior of the computational functional block comprises an amount of change between results of specified operations when executing the test portion of the workload; and

the threshold is a specified value of an amount of change.

7. The electronic device of claim 1, wherein:

the electronic device comprises a plurality of versions of a software application for which the workload is executed, each version of the software application configured to perform operations using at least one of operands or results of a different precision level from among the set of two or more precision levels;

executing the test portion of the workload at the at least one precision level comprises executing the test portion using a corresponding version of the software application; and

configuring the computational block to execute the remaining portion of the workload at the given precision level comprises configuring the computational block to use a given version of the software application.

8. The electronic device of claim 1, wherein:

the electronic device comprises a software application for which the workload is executed, the software application including generic instructions that are dynamically configurable to use data of precision levels from among the set of two or more precision levels;

executing the test portion of the workload at the at least one precision level comprises executing the test portion using the software application with the generic instructions configured to use at least one of operands or results of a corresponding precision level; and

configuring the computational block to execute the remaining portion of the workload at the given precision level comprises configuring the computational block to use the software application with the generic instructions configured to use at least one of operands or results of the given precision level.

9. The electronic device of claim 1, wherein the controller functional block is further configured to receive a specification of the at least one precision level for executing the test portion of the workload.

10. The electronic device of claim 1, wherein the test portion includes a small proportion of operations for the workload and the remaining portion includes a large proportion of operations for the workload.

11. The electronic device of claim 1, wherein the precision levels are characterized at least in part by a number of bits used for at least one of operands or results when performing operations, each precision level having a different number of bits.

12. The electronic device of claim 1, wherein the controller functional block performs the monitoring, selecting, and configuring one or more times during a runtime of the electronic device, thereby dynamically configuring a precision level of the computational functional block for executing the workload or other workloads.

13. The electronic device of claim 1, wherein the workload comprises operations for one of a neural network, a limited precision computation, a counter, a machine learning or deep learning application, a video or audio processing application, or a trend analysis.

14. A method for operating an electronic device that comprises a hardware controller functional block and a hardware computational functional block, the method comprising:

by the controller functional block;

while the computational functional block executes a test portion of a workload at at least one precision level, monitoring a behavior of the computational functional block;

based on the behavior of the computational functional block while executing the test portion of the workload at the at least one precision level, selecting a given precision level from among a set of two or more precision levels at which the computational functional block is to execute a remaining portion of the workload; and

configuring the computational block to execute the remaining portion of the workload at the given precision level.

15. The method of claim 14, wherein selecting the given precision level comprises:

when the behavior of the computational functional block while the computational functional block executes a test portion of a workload at the at least one precision level exceeds at least one threshold, selecting the given precision level; and

otherwise selecting a different precision level from among the set of two or more precision levels.

16. The method of claim 15, wherein:

executing the test portion of the workload at the at least one precision level comprises executing the test portion of the workload at each of a higher-precision precision level and a lower-precision precision level; and

selecting the given precision level comprises;

when a difference in the behavior of the computational functional block when executing the test portion of the workload at the higher-precision precision level and the lower-precision precision level exceeds a threshold, selecting the higher-precision precision level as the given precision level; and

otherwise, selecting the lower-precision precision level as the given precision level.

17. The method of claim 15, wherein:

the behavior of the computational functional block comprises a number of iterations performed when executing the test portion of the workload; and

the threshold is a specified value of a number of iterations.

18. The method of claim 15, wherein:

the behavior of the computational functional block comprises at least one result generated when executing the test portion of the workload; and

the threshold is a specified value of the at least one result.

19. The method of claim 14, wherein:

the electronic device comprises a plurality of versions of a software application for which the workload is executed, each version of the software application configured to perform operations using at least one of operands or results of a different precision level from among the set of two or more precision levels;

executing the test portion of the workload at the at least one precision level comprises executing the test portion using a corresponding version of the software application; and

configuring the computational block to execute the remaining portion of the workload at the given precision level comprises configuring the computational block to use a given version of the software application.

20. The method of claim 14, wherein:

the electronic device comprises a software application for which the workload is executed, the software application including generic instructions that are dynamically configurable to use data of precision levels from among the set of two or more precision levels;

executing the test portion of the workload at the at least one precision level comprises executing the test portion using the software application with the generic instructions configured to use at least one of operands or results of a corresponding precision level; and

configuring the computational block to execute the remaining portion of the workload at the given precision level comprises configuring the computational block to use the software application with the generic instructions configured to use at least one of operands or results of the given precision level.