SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM INCLUDING THE SEMICONDUCTOR DEVICE
First Claim
1. A semiconductor system comprising:
- a first semiconductor device configured to control a test mode, configured to output a chip identification, and configured to receive external data; and
a second semiconductor device configured to include a plurality of memory chips,wherein, while a write operation is performed in the test mode, one or more memory chips from the plurality of memory chips are activated based on the chip identification to store input data into each of the plurality of memory chips that have been activated, andwherein at least two of the plurality of memory chips are activated in response to the chip identification to output the stored input data as the external data while a read operation is performed in the test mode.
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Accused Products
Abstract
A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device controls a test mode. The first semiconductor device outputs a chip identification and receives external data. The second semiconductor device includes a plurality of memory chips. At least one of the plurality of memory chips are activated based on the chip identification to store input data into each of the plurality of memory chips that have been activated while a write operation is performed in the test mode. At least two of the plurality of memory chips are activated based on the chip identification to output the stored input data as the external data while a read operation is performed in the test mode.
11 Citations
20 Claims
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1. A semiconductor system comprising:
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a first semiconductor device configured to control a test mode, configured to output a chip identification, and configured to receive external data; and a second semiconductor device configured to include a plurality of memory chips, wherein, while a write operation is performed in the test mode, one or more memory chips from the plurality of memory chips are activated based on the chip identification to store input data into each of the plurality of memory chips that have been activated, and wherein at least two of the plurality of memory chips are activated in response to the chip identification to output the stored input data as the external data while a read operation is performed in the test mode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A semiconductor device comprising:
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a first group of memory chips vertically stacked, wherein one or more memory chips of the first group are activated during a write operation in a test mode to store input data into each of the memory chips that have been activated in the first group, and the input data stored in one or more of the memory chips of the first group, which is activated by a chip identification, is outputted as first external data through a first main pad during a read operation; and a second group of memory chips vertically stacked, wherein one or more memory chips of the second group are activated during the write operation in the test mode to store the input data into each of the memory chips that have been activated in the second group, and the input data stored in one or more of the memory chips of the second group, which is activated by the chip identification, is outputted as second external data through a second main pad during the read operation. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification