SEMICONDUCTOR-PRODUCT TESTING DEVICE, METHOD FOR TESTING SEMICONDUCTOR PRODUCT, AND SEMICONDUCTOR PRODUCT
First Claim
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1. A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product, the device comprising:
- a pattern memory that stores a part of the test pattern,wherein the pattern memory is rewritten during a time when the semiconductor product is tested by using the part of the test pattern stored in the pattern memory as a partial test pattern.
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Abstract
A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product includes a pattern memory that stores a part of the test pattern. The pattern memory is rewritten during a time when the semiconductor product is tested by a part of the test pattern stored in the pattern memory included in the semiconductor-product testing device.
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Citations
16 Claims
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1. A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product, the device comprising:
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a pattern memory that stores a part of the test pattern, wherein the pattern memory is rewritten during a time when the semiconductor product is tested by using the part of the test pattern stored in the pattern memory as a partial test pattern. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method for testing a semiconductor product, comprising:
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a test pattern portion storing step of dividing a test pattern for testing a semiconductor product into a plurality of test pattern portions and storing the test pattern portions in a pattern memory; and a test pattern portion supplying of supplying the test pattern portions stored in the pattern memory to the semiconductor product, wherein in the test pattern portion supplying step, during a time when a first test pattern portion stored in the pattern memory is supplied to the semiconductor product, the pattern memory is rewritten with a second test pattern portion supplied later than the first test pattern portion. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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Specification