SAMPLE MANIPULATION FOR NONDESTRUCTIVE SAMPLE IMAGING
First Claim
Patent Images
1. A system for imaging a sample, the system comprising:
- a sample holder configured to secure the sample within a vacuum chamber;
an electron beam generator configured to produce an electron beam within the vacuum chamber;
an electron detector configured to measure electrons from the electron beam that have interacted with the sample;
a spectral energy detector configured to measure fluorescent X-rays resulting from the electron beam interacting with at least one of (a) the sample and (b) a target positioned between the sample and the electron beam generator;
a coarse motion stage capable of moving the sample holder along and around each of an x-axis, a y-axis, and a z-axis, thereby providing the sample holder with a first set of six degrees-of-freedom;
a fine motion stage that is coupled to the coarse motion stage, and that is also capable of moving the sample holder along and around the x-axis, the y-axis, and the z-axis, thereby providing the sample holder with a second set of six degrees-of-freedom, wherein the fine motion stage has a higher resolution of movement than the course motion stage;
a controller that is communicatively coupled with the electron beam generator, the electron detector, the spectral energy detector, the fine motion stage, and the coarse motion stage; and
a processor configured to receive data from the electron detector and the spectral energy detector, and further configured to generate control instructions that, when implemented by the controller, result in movement of at least one of the fine motion stage and the coarse motion stage.
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Abstract
A system and method for imaging a sample having a complex structure (such as an integrated circuit). The sample is placed on a motion system that moves the sample with respect to an electron beam generator that is used in imaging the sample. The motion system affords thirteen degrees-of-freedom for movement of the sample, by providing a rotation stage, a fine 6-axis piezoelectric-driven stage, and a coarse 6-axis hexapod stage. Various detectors gather information to image the sample. Interferometric and/or capacitive sensors are used to measure the position of the sample and motion system.
9 Citations
24 Claims
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1. A system for imaging a sample, the system comprising:
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a sample holder configured to secure the sample within a vacuum chamber; an electron beam generator configured to produce an electron beam within the vacuum chamber; an electron detector configured to measure electrons from the electron beam that have interacted with the sample; a spectral energy detector configured to measure fluorescent X-rays resulting from the electron beam interacting with at least one of (a) the sample and (b) a target positioned between the sample and the electron beam generator; a coarse motion stage capable of moving the sample holder along and around each of an x-axis, a y-axis, and a z-axis, thereby providing the sample holder with a first set of six degrees-of-freedom; a fine motion stage that is coupled to the coarse motion stage, and that is also capable of moving the sample holder along and around the x-axis, the y-axis, and the z-axis, thereby providing the sample holder with a second set of six degrees-of-freedom, wherein the fine motion stage has a higher resolution of movement than the course motion stage; a controller that is communicatively coupled with the electron beam generator, the electron detector, the spectral energy detector, the fine motion stage, and the coarse motion stage; and a processor configured to receive data from the electron detector and the spectral energy detector, and further configured to generate control instructions that, when implemented by the controller, result in movement of at least one of the fine motion stage and the coarse motion stage. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system for imaging a sample, the system comprising:
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a sample holder configured to secure the sample within a vacuum chamber; an electron beam generator configured to produce an electron beam within the vacuum chamber; a coarse motion stage positioned within the vacuum chamber, the coarse motion stage providing movement along a first axis that provides a first degree-of-freedom, movement along a second axis perpendicular to the first axis that provides a second degree-of-freedom, movement along a third axis perpendicular to the first and second axes that provides a third degree-of-freedom, rotation around the first axis that provides a fourth degree-of-freedom, rotation around the second axis that provides a fifth degree-of-freedom, and rotation around the third axis that provides a sixth degree-of-freedom; a fine motion stage positioned within the vacuum chamber laterally above the coarse motion stage, the fine motion stage providing movement along a fourth axis that provides a seventh degree-of-freedom, movement along a fifth axis perpendicular to the fourth axis that provides an eighth degree-of-freedom, movement along a sixth axis perpendicular to the fourth and fifth axes that provides a ninth degree-of-freedom, rotation around the fourth axis that provides a tenth degree-of-freedom, rotation around the fifth axis that provides an eleventh degree-of-freedom, and rotation around the sixth axis that provides a twelfth degree-of-freedom; and a rotation stage positioned within the vacuum chamber laterally above the fine motion stage, the rotation stage providing rotation around a seventh axis that provides a thirteenth degree-of-freedom. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A system for imaging a sample, the system comprising:
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a sample holder configured to secure the sample within a vacuum chamber; an electron beam generator configured to produce an electron beam within the vacuum chamber; a moving platform having a rotation stage, a fine motion stage, and a coarse motion stage; one or more interferometric sensors that provide interferometric measurements; a fixture mounted at a base of the rotation stage that supports a first set of reference mirrors that are used in providing the interferometric measurements; and a second set of reference mirrors that are mounted to the sample holder and that are used in providing the interferometric measurements. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24)
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Specification