SYSTEM AND METHOD FOR ANALYZING TEST DEVICES

• US 20190318468A1
• Filed: 04/15/2019
• Published: 10/17/2019
• Est. Priority Date: 04/16/2018
• Status: Active Grant

• Current Assignee: Pinqkerton SAS
• Original Assignee: Pinqkerton SAS
• Inventors: PEASE, Christopher
• Granted Patent: US 11,145,044 B2
• Time in Patent Office: Days
• CPC Class Codes: C12M 41/36 of biomass, e.g. colony counters or by turbidity measurements electrooptical investigation of individual particles G01N15/14, flow cytometers G01N15/1404
• CPC Class Codes: G01N 21/78 producing a change of colour
• CPC Class Codes: G06F 2218/12 Classification; Matching
• CPC Class Codes: G06F 9/542 Event management; Broadcasting; Multicasting; Notifications
• CPC Class Codes: G06T 2201/0051 Embedding of the watermark in the spatial domain
• CPC Class Codes: G06T 2207/10008 from scanner, fax or copier
• CPC Class Codes: G06T 5/80 Geometric correction
• CPC Class Codes: G06T 7/0002 Inspection of images, e.g. flaw detection
• CPC Class Codes: G06T 7/33 using feature-based methods
• CPC Class Codes: G06T 7/62 of area, perimeter, diameter or volume

Abstract

The invention concerns in particular the analysis of a test device. After having obtained at least one image of a test device, the image comprising at least one representation of at least one portion of an observation surface and a visible reference having a predetermined format, the test device is identified according to the visible reference as well as a graphical element present in the portion of the observation surface. At least one geometrical feature of a graphical element identified according to at least the visible reference is then determined and the portion of the observation surface is analyzed according to an identification of the test device and at least one determined geometrical feature.

Claims

1. A method of analyzing a test device, the method comprising:

obtaining at least one image of a test device, the image comprising at least one representation of at least one portion of an observation surface and a visible reference having a predetermined format;

identifying a test device according to the visible reference;

identifying a graphical element in the at least one portion of the observation surface;

determining at least one geometrical feature of a graphical element identified according to at least the visible reference; and

analyzing the at least one portion of the observation surface according to an identification of the test device and at least one determined geometrical feature.

2. The method according to claim 1, wherein the analysis step comprises a step of comparing the at least one determined geometrical feature with at least one geometrical feature of a graphical element identified in a portion of an observation surface represented in another image of the same test device.

3. The method according to claim 2, further comprising a step of projecting at least part of the at least one portion of the observation surface.

4. The method according to claim 1, wherein the steps of identifying a test device, identifying a graphical element in the at least one portion of the observation surface and of determining at least one geometrical feature are repeated for at least one second image of the test device, the analysis step comprising a step of comparing at least one geometrical feature determined from a first image of a test device with at least one geometrical feature determined from a second image of the same test device.

5. The method according to claim 4, further comprising a step of determining a frame of reference according to the visible reference, the at least one geometrical feature being determined according to the determined frame of reference.

6. The method according to claim 1, further comprising a notification step giving notification that a new image has been obtained, the notification being given according to an identification of the test device determined from an image obtained previously.

7. The method according to claim 6, wherein the notification step comprises a step of obtaining a test information item, the test information item being obtaining according to the test device identification determined from the image obtained previously.

8. The method according to claim 1, further comprising a step of storing the received image and the test device identification determined from the obtained image.

9. The method according to claim 1, wherein the at least one geometrical feature comprises a size, a shape and/or coordinates.

10. A computer program comprising instructions adapted for carrying out each of the steps of the method according to claim 1 when said program is executed on a computer.

11. A system for analyzing a test device, the system comprising a microprocessor configured for carrying out the steps of,

obtaining at least one image of a test device, the image comprising at least one representation of at least one portion of an observation surface and a visible reference having a predetermined format;

identifying a test device according to the visible reference;

identifying a graphical element in the at least one portion of the observation surface;

determining at least one geometrical feature of a graphical element identified according to at least the visible reference; and

analyzing the at least one portion of the observation surface according to an identification of the test device and at least one determined geometrical feature.

12. The system according to claim 11, wherein the microprocessor if further configured so that the analysis step comprises a step of comparing the at least one determined geometrical feature with at least one geometrical feature of a graphical element identified in a portion of an observation surface represented in another image of the same test device.

13. The system according to claim 12, wherein the microprocessor is further configured for carrying out a step of projecting at least part of the at least one portion of the observation surface.

14. The system according to claim 11, wherein the microprocessor is further configured so that the steps of identifying a test device, identifying a graphical element in the at least one portion of the observation surface and of determining at least one geometrical feature are repeated for at least one second image of the test device, the analysis step comprising a step of comparing at least one geometrical feature determined from a first image of a test device with at least one geometrical feature determined from a second image of the same test device.

15. The system according to claim 14, wherein the microprocessor is further configured for carrying out a step of determining a frame of reference according to the visible reference, the at least one geometrical feature being determined according to the determined frame of reference.

16. The system according to claim 11, wherein the microprocessor is further configured for carrying out a notification step giving notification that a new image has been obtained, the notification being given according to an identification of the test device determined from an image obtained previously.

17. The system according to claim 16, wherein the microprocessor is further configured so that the notification step comprises a step of obtaining a test information item, the test information item being obtaining according to the test device identification determined from the image obtained previously.

18. The system according to claim 11, comprising a device of smartphone type for image capture, image correction and analysis of images.

19. The system according to claim 11, comprising a first device for image capture and a second device for analysis of images, distinct from the first device.