ORGANIC-INORGANIC HYBRID MATERIAL AND METHOD FOR SILICON SURFACE PASSIVATION
First Claim
1. Hybrid organic-inorganic material consisting of an organic conductor polymer matrix and transparent conducting oxide nanostructures as filler, where the conductive polymer is PEDOT:
- PSS and the nanostructures are dispersed in the polymer in a ratio of 0.1-10% wt., preferably of 0.25%-5% wt.
1 Assignment
0 Petitions
Accused Products
Abstract
A relevant technological challenge is the low cost and abundant materials development for silicon surface passivation for applications in optoelectronic devices, in particular in solar cells by scalable industrial methods. In the present invention, a new hybrid material comprising PEDOT:PSS and transparent conducting oxide nanostructures is developed and a method is proposed to fabricate the composite material that passivates well the silicon surface to be used by means of a thin composite film of thickness below 200 nm.
0 Citations
14 Claims
-
1. Hybrid organic-inorganic material consisting of an organic conductor polymer matrix and transparent conducting oxide nanostructures as filler, where the conductive polymer is PEDOT:
- PSS and the nanostructures are dispersed in the polymer in a ratio of 0.1-10% wt., preferably of 0.25%-5% wt.
- View Dependent Claims (2, 3, 4, 5, 6)
-
7. A method for fabricating a hybrid composite containing an organic conductor as host and semiconducting nanostructures as filler, comprising at least the steps of:
-
Providing an aqueous dispersion of a conductive polymer. Providing transparent conducting oxide nanostructures with controlled size and doping by techniques such as hydrolysis, modified Pechini method or vapour-solid method. Adding the nanostructures in the ratios lower than 10% wt, preferably in a ratio 0.25-5% wt., at the aqueous dispersion under ultra-sonication.
-
- 8. Passivation method comprising the deposition of the hybrid composite by the spin coating technique of one or several layers of the hybrid material over a substrate, and subsequent water removal.
-
9. Passivation method as claimed in 8, where the water is removed by a thermal treatment, at a temperature range of 100-130°
- C., preferably 110-125°
C. during 10 to 30 minutes, preferably 15 to 25 minutes.
- C., preferably 110-125°
-
10. Passivation method as claimed in 8, where the deposited layer has a thickness below 200 nm, preferably in a range of 90-150 nm.
Specification