DARK FIELD TENSOR TOMOGRAPHY METHOD, SPECIMEN HOLDER AND DEVICE
First Claim
1. An X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample (60) by means of X-rays, whereina sample (60) is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis,in every orientation of the sample (60) on the basis of dark-field signals a plurality of scatter data sets is recorded, andthe scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample (60).
1 Assignment
0 Petitions
Accused Products
Abstract
The invention relates to an X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample (60) by means of X-rays, with which method a sample (60) is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis, in every orientation of the sample (60) on the basis of dark-field signals a plurality of scatter data sets is recorded, and the scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample (60).
-
Citations
15 Claims
-
1. An X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample (60) by means of X-rays, wherein
a sample (60) is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis, in every orientation of the sample (60) on the basis of dark-field signals a plurality of scatter data sets is recorded, and the scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample (60).
Specification