METHOD AND APPARATUS FOR BUILT-IN SELF-TEST
First Claim
Patent Images
1. An apparatus comprising:
- one or more non-clock and data recovery (CDR) components comprising one or more amplifiers on a substrate;
a signal generator on the substrate and coupled to at least one of the one or more non-CDR components; and
a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is;
configured to recover clock data from a received signal by the CDR component, andconfigured to determine a signal based on the received signal and the clock data.
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Abstract
An apparatus comprises one or more non-clock and data recovery (CDR) components on a substrate, a signal generator on the substrate and coupled to at least one of the one or more non-CDR components, and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data.
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Citations
39 Claims
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1. An apparatus comprising:
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one or more non-clock and data recovery (CDR) components comprising one or more amplifiers on a substrate; a signal generator on the substrate and coupled to at least one of the one or more non-CDR components; and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is; configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data. - View Dependent Claims (3, 4, 5, 6, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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2. (canceled)
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7-8. -8. (canceled)
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18-24. -24. (canceled)
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25. A method of using an apparatus, the apparatus comprising:
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one or more non-clock and data recovery (CDR) components on a substrate; a signal generator on the substrate and coupled to at least one of the one or more non-CDR components; and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is; configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data, and the method comprising; providing, by the signal generator, a test signal with one or more adjustable parameters; passing the test signal subsequently through one or more components selected from a group consisting of the one or more non-CDR components and the CDR component; determining a measure upon receipt of the test signal; determining whether the one or more components function properly based on the measure; obtaining a first measure with respect to a first group of components on the substrate; obtaining a second measure with respect to a second group of components on the substrate, the second group being part of the first group; determining a characteristic with respect to a difference set of the first group and the second group based on the first measure and the second measure; and determining whether the difference set functions properly based on the characteristic. - View Dependent Claims (27, 28, 29, 30, 32, 33, 34, 35)
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26. (canceled)
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31. (canceled)
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36. A method of using an apparatus, the apparatus comprising:
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one or more non-clock and data recovery (CDR) components on a substrate; a signal generator on the substrate and coupled to at least one of the one or more non-CDR components; and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is; configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data, and the method comprising; providing, by the signal generator, a test signal with one or more adjustable parameters; determining a set of first parameters for the test signal; adjusting the test signal according to the set of first parameters; and determining sensitivity of a second parameter for the test signal, the sensitivity of the second parameter being indicative of a minimal value or a maximal value of the second parameter, given the set of first parameters excluding the second parameter, which allows one or more components that the test signal passes through function properly. - View Dependent Claims (37, 38)
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39-60. -60. (canceled)
Specification