METHOD FOR STRUCTURING A SUBSTRATE, ASSEMBLY COMPRISING A SUBSTRATE AND A DEVICE FOR STRUCTURING SAID SUBSTRATE, AND SUBSTRATE WITH SUCH A STRUCTURE
First Claim
1. A method for structuring a substrate having an upper surface and a lower surface, said method comprising the following steps:
- a) providing a device comprising;
a light source for generating a structuring incoming light beam capable of machining said upper surface of said substrate;
an optical system for obtaining, from said incoming light beam, an outgoing light beam spatially offset in relation to said incoming light beam, said optical system being capable of modifying the spatial offset between said incoming light beam and said outgoing light beam;
focusing means for focusing said outgoing light beam;
a substrate holder;
a movement device for generating a relative movement between said outgoing light beam and said substrate holder;
b) providing and placing said substrate on said substrate holder so as to have towards said focusing means its upper surface characterized by a normal;
c) generating with the light source the incoming light beam;
d) generating from the incoming light beam as it passes through the optical system, then through the focusing means, a focused outgoing light beam describing with said normal of said upper surface of said substrate at a focusing point of said outgoing light beam an angle of attack greater than 1°
, preferably greater than 3°
, for any spatial offset between outgoing light beam and incoming light beam imposed by said optical system;
e) initiating a relative movement between said substrate holder supporting said substrate and said focused outgoing light beam for etching a pattern from the upper surface of said substrate, said formed pattern comprising a cavity in the substrate opening through an opening at the upper surface of the substrate;
defining parameters of said light source according to said relative movement initiated in step e) for generating said incoming light beam such that the cavity of the formed pattern is non-through between said upper surface and said lower surface of said substrate.
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Accused Products
Abstract
Method for structuring a substrate (11) and comprising the following steps: —providing a device (100) comprising a light source (33), an optical system (2) for obtaining an outgoing light beam (7) spatially offset in relation to the incoming light beam (1), and capable of modifying this spatial offset, focusing means (9) for focusing the outgoing light beam (7), a substrate holder (59), a movement device (60) for generating a movement (41) between the outgoing light beam (7) and the substrate (11); —providing and placing the substrate (11) on the substrate holder (59); —etching the substrate with the focused outgoing light beam (7) having an angle of attack (107) greater than 1° for any spatial offset between outgoing light beam (7) and incoming light beam (1) imposed by the optical system (2).
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25 Claims
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1. A method for structuring a substrate having an upper surface and a lower surface, said method comprising the following steps:
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a) providing a device comprising; a light source for generating a structuring incoming light beam capable of machining said upper surface of said substrate; an optical system for obtaining, from said incoming light beam, an outgoing light beam spatially offset in relation to said incoming light beam, said optical system being capable of modifying the spatial offset between said incoming light beam and said outgoing light beam; focusing means for focusing said outgoing light beam; a substrate holder; a movement device for generating a relative movement between said outgoing light beam and said substrate holder; b) providing and placing said substrate on said substrate holder so as to have towards said focusing means its upper surface characterized by a normal; c) generating with the light source the incoming light beam; d) generating from the incoming light beam as it passes through the optical system, then through the focusing means, a focused outgoing light beam describing with said normal of said upper surface of said substrate at a focusing point of said outgoing light beam an angle of attack greater than 1°
, preferably greater than 3°
, for any spatial offset between outgoing light beam and incoming light beam imposed by said optical system;e) initiating a relative movement between said substrate holder supporting said substrate and said focused outgoing light beam for etching a pattern from the upper surface of said substrate, said formed pattern comprising a cavity in the substrate opening through an opening at the upper surface of the substrate; defining parameters of said light source according to said relative movement initiated in step e) for generating said incoming light beam such that the cavity of the formed pattern is non-through between said upper surface and said lower surface of said substrate. - View Dependent Claims (2, 5, 8, 9, 10, 14, 15, 16)
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3-4. -4. (canceled)
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6-7. -7. (canceled)
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11-13. -13. (canceled)
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17. An assemblage comprising a substrate having an upper surface and a lower surface and a device for structuring said substrate, said device comprising:
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a light source for generating a structuring incoming light beam capable of machining said upper surface of said substrate; an optical system for obtaining, from said incoming light beam, an outgoing light beam spatially offset in relation to said incoming light beam, said optical system being capable of modifying the spatial offset between said incoming light beam and said outgoing light beam; focusing means for focusing said outgoing light beam; a substrate holder; a movement device for generating a relative movement between said outgoing light beam and said substrate holder; said substrate being placed on said substrate holder so as to have towards said focusing means its upper surface characterized by a normal, said device being configured so that said focused outgoing light beam and said normal of said upper surface of said substrate at a focusing point of said outgoing light beam are separated by an angle of attack greater than 1°
, preferably greater than 3°
, for any spatial offset between the outgoing light beam and the incoming light beam imposed by said optical systemparameters of said light source are defined according to said relative movement for generating said incoming light beam such that the cavity of the formed pattern is non-through between said upper surface and said lower surface of said substrate. - View Dependent Claims (19, 20, 21, 22, 24)
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18. (canceled)
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23. (canceled)
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25-26. -26. (canceled)
Specification