LIGHT PROJECTION CALIBRATION DEVICE FOR DETERMINING WHETHER LIGHT EMISSION ELEMENT AND OPTICAL ELEMENT ARE ALIGNED TO ACCEPTABLE LEVEL

• US 20200132440A1
• Filed: 10/29/2018
• Published: 04/30/2020
• Est. Priority Date: 10/29/2018
• Status: Abandoned Application

• Current Assignee: Himax Technologies Ltd. (Himax Technologies Incorporated)
• Original Assignee: Himax Technologies Ltd. (Himax Technologies Incorporated)
• Inventors: Liu, Yi-Nung, Chi, Cheng-Hung, Hsiao, Ming-Shu
• Application Number:
  US16/172,869
• Publication Number:
  US 20200132440A1
• Time in Patent Office: Days
• CPC Class Codes: G01B 11/2504 Calibration devices
• CPC Class Codes: G01J 1/4257 applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam monitoring arrangements for lasers in general H01S3/0014
• CPC Class Codes: G02B 27/0944 Diffractive optical elements, e.g. gratings, holograms gratings per se G02B5/18; holograms used as optical elements per se G02B5/32
• CPC Class Codes: G02B 27/30 Collimators
• CPC Class Codes: G02B 27/62 Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
• CPC Class Codes: G03B 21/204 using secondary light emission, e.g. luminescence or fluorescence using different colours G03B33/00; if related to video signals H04N9/3197
• CPC Class Codes: G03B 43/00 Testing correct operation of photographic apparatus or parts thereof

Abstract

A light projection calibration device includes a light emission element and an optical element. The light emission element is used to emit light and includes a plurality of light emission points. The plurality of light emission points are used to emit the light and orderly arranged to form a predetermined pattern. The optical element is disposed according to position of the light emission element and used to diffract the light to generate diffracted light. The diffracted light is projected to a far field plane to generate a plurality of fan-out points on the far field plane. The fan-out points are analyzed to obtain a light intensity waveform used to determine whether the light emission element and the optical element are aligned to an acceptable level.

Claims

1. A light projection calibration device, comprising:

a light emission element configured to emit at least first light and comprising;

a plurality of first light emission points configured to emit the first light and orderly arranged to form a predetermined pattern; and

an optical element disposed according to position of the light emission element and configured to diffract at least the first light to generate diffracted light;

wherein the diffracted light is projected to a far field plane to generate at least a plurality of first fan-out points on the far field plane, the plurality of first fan-out points are analyzed to obtain a light intensity waveform used to determine whether the light emission element and the optical element are aligned to an acceptable level, a first portion of the diffracted light corresponding to one fan-out point of the plurality of first fan-out points forms a first diffracted pattern, a second portion of the diffracted light corresponding to another fan-out point of the plurality of first fan-out points forms a second diffracted pattern, the first diffracted pattern and the second diffracted pattern are generated according to the predetermined pattern, and when the light emission element and the optical element are aligned to the acceptable level, the first diffracted pattern substantially aligns with the second diffracted pattern.

2. The light projection calibration device of claim 1, further comprising:

a processing unit configured to sense the plurality of first fan-out points projected on the far field plane, generate the light intensity waveform, analyze the light intensity waveform, and determine whether the light emission element and the optical element are aligned to the acceptable level.

3. The light projection calibration device of claim 2, wherein the processing unit comprises:

an image sensor configured to sense the plurality of first fan-out points distributed on the far field plane to generate sensing data; and

a processor coupled to the image sensor and configured to process the sensing data, generate and analyze light intensity waveform accordingly, and determine whether the light emission element and the optical element are aligned to the acceptable level.

4. The light projection calibration device of claim 2, wherein the processing unit determines the light emission element and the optical element are aligned to the acceptable level when the light intensity waveform reaches a predetermined amplitude.

5. The light projection calibration device of claim 2, further comprising:

a rotation unit configured to rotate the light emission element and/or the optical element till the light emission element and the optical element are aligned to the acceptable level.

6. The light projection calibration device of claim 5,

wherein the rotation unit comprises a step motor to rotate the rotate the light emission element and/or the optical element one step at a time.

7. The light projection calibration device of claim 1, wherein a collimator is disposed between the light emission element and the optical element.

8. The light projection calibration device of claim 1, wherein the predetermined pattern comprises at least a segment.

9. The light projection calibration device of claim 1, wherein the predetermined pattern comprises a cross pattern formed by two segments.

12. The light projection calibration device of claim 1, wherein the diffracted light is projected to the far field plane to further generate a plurality of second fan-out points.

13. The light projection calibration device of claim 12, wherein the plurality of first fan-out points are orderly arranged, and the plurality of second fan-out points are orderly or randomly arranged with the plurality of first fan-out points.

14. The light projection calibration device of claim 1, wherein the light emission element further comprises a plurality of second light emission points configured to emit second light.

15. The light projection calibration device of claim 14, wherein the plurality of second light emission points are orderly or randomly arranged with the plurality of first light emission points.

10-11. -11. (canceled)