DOCKING STATION FOR A SURFACE MEASURING APPARATUS

• US 20200132593A1
• Filed: 06/15/2018
• Published: 04/30/2020
• Est. Priority Date: 06/29/2017
• Status: Active Grant

• Current Assignee: BYK-Gardner GmbH (Susanne Klatten, MBA)
• Original Assignee: BYK-Gardner GmbH (Susanne Klatten, MBA)
• Inventors: SCHWARZ, Peter
• Granted Patent: US 11,060,966 B2
• Time in Patent Office: Days
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
• CPC Class Codes: G01J 3/524 Calibration of colorimeters
• CPC Class Codes: G01N 21/255 Details, e.g. use of specially adapted sources, lighting or optical systems
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G01N 21/57 Measuring gloss
• CPC Class Codes: G01N 2201/0221 Portable; cableless; compact; hand-held

Abstract

The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.

Claims

1. A docking station for an in particular optical surface measuring apparatus having at least one reference measuring surface which can be brought into at least one covered state in which it is covered from the environment of the docking station and at least one uncovered state in which it is not covered from the environment of the docking station so that the surface measuring apparatus, when accommodated in the docking station and the at least one reference measuring surface is in the at least one uncovered state, can perform a reference measurement of the at least one reference measuring surface.

2. The docking station according to claim 1, wherein the at least one reference measuring surface is movable relative to the docking station into at least one covered position in which it is covered from the environment of the docking station, particularly by a housing of the docking station, whereby the at least one reference measuring surface can be brought into a covered state, and that the at least one reference measuring surface is movable relative to the docking station into at least one uncovered position which differs from the at least one covered position in which it is not covered from the environment of the docking station, whereby the at least one reference measuring surface can be brought into an uncovered state.

3. The docking station according to claim 2, wherein the docking station further comprises at least one closure which is movable relative to the docking station into at least one closed position, in which it closes an opening in the housing of the docking station and at least one open position, in which it does not close said opening, wherein the closed position of the at least one closure corresponds to the uncovered position of the at least one reference measuring surface.

4. The docking station according to claim 3, wherein in each case, the movement of the at least one reference measuring surface and the movement of the at least one closure is a pivoting motion, and that the two pivoting movements are mechanically coupled, in particular by a lever mechanism.

5. The docking station according to claim 1, wherein the docking station has a plurality of reference measuring surfaces, in particular two, three, four, five, six or more.

6. The docking station according to claim 5, wherein the positions of the reference measuring surfaces relative to each other are not changeable.

7. The docking station according to claim 6, wherein the number of possible positions of each reference measuring surface is equal to the number of reference measuring surfaces, and that of said possible positions, exactly one position is an uncovered position and the remaining positions are covered positions.

8. The docking station according to claim 6, wherein the movement of the reference measuring surfaces between their possible positions is a rotational movement about a common axis, wherein in particular, all the reference measuring surfaces are arranged on a common revolving mechanism.

9. The docking station according to claim 1, wherein the docking station comprises means, in particular magnetic means or latching means, for at least temporarily fixing the at least one reference measuring surface in the at least one uncovered position.

10. The docking station according to claim 1, wherein the at least one reference measuring surface is not movable relative to the docking station, that the docking station further comprises at least one cover which is movable into a covered position in which it covers the at least one reference measuring surface from the environment of the docking station, whereby the at least one reference measuring surface can be brought into a covered state, and into an uncovered position in which it does not cover the at least one reference measuring surface from the environment of the docking station, whereby the at least one reference measuring surface can be brought into an uncovered state.

11. The docking station according to claim 10, wherein the movement of the at least one cover from the at least one covered position into the at least one uncovered position can be triggered by the surface measuring apparatus being introduced into the docking station and/or that the movement of the at least one cover from the at least one uncovered position into the at least one covered position can be triggered by the surface measuring apparatus being removed from the docking station.

12. The docking station according to claim 11, wherein the cover is movable between the at least one uncovered position and the at least one covered position by a lever mechanism able to be actuated by the surface measuring apparatus.

13. The docking station according to claim 1, wherein the at least one reference measuring surface can be aligned into the at least one uncovered state for the performing of the reference measurement.

14. The docking station according to claim 13, wherein the alignment of the at least one reference measuring surface for performing the reference measurement can be initiated upon contact with the surface measuring apparatus.

15. The docking station according to claim 13, wherein the at least one reference measuring surface is supported on an elastic element, in particular an elastomer element or a foam element.

16. The docking station according to claim 1, wherein the docking station comprises means, in particular magnetic means or latching means, for at least temporarily fixing the surface measuring apparatus in the docking station.

17. A calibration method for a surface measuring apparatus having the steps:

a) introducing the surface measuring apparatus a docking station according to claim 1,

b) bringing the at least one reference measuring surface into the at least one uncovered state,

c) performing a reference measurement of the at least one reference measuring surface with the surface measuring apparatus and calibrating the surface measuring apparatus using the reference measurement,

d) removing the surface measuring apparatus from the docking station, and

e) bringing the at least one reference measuring surface into the at least one covered state,

wherein step b) is performed before, during or after step a), and/or step e) before, during, or after step d), and the steps are otherwise performed in the order indicated.

18. The calibration method according to claim 17, whereby step b) is triggered by step a), and/or step e) triggered by step d).

19. The calibration method according to claim 17, whereby step b) is triggered independently of step a) and/or step e) triggered independently of step d) by the user of the surface measuring apparatus, in particular via at least one control element on the docking station and/or on the surface measuring apparatus.

20. The calibration method according to claim 17, wherein at least one of the parameters

temperature of the surface measuring apparatus,

ambient temperature,

number of measurements performed by the surface measuring apparatus since its last calibration,

length of time since the last calibration of the surface measuring apparatus, and

age of the surface measuring apparatus or individual components of the surface measuring apparatus, in particular a light source of the surface measuring apparatus,

is determined and step c), preferably also step b) and/or step e), is automatically triggered depending on the result of the determination.