DOCKING STATION FOR A SURFACE MEASURING APPARATUS
First Claim
1. A docking station for an in particular optical surface measuring apparatus having at least one reference measuring surface which can be brought into at least one covered state in which it is covered from the environment of the docking station and at least one uncovered state in which it is not covered from the environment of the docking station so that the surface measuring apparatus, when accommodated in the docking station and the at least one reference measuring surface is in the at least one uncovered state, can perform a reference measurement of the at least one reference measuring surface.
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Accused Products
Abstract
The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.
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Citations
20 Claims
- 1. A docking station for an in particular optical surface measuring apparatus having at least one reference measuring surface which can be brought into at least one covered state in which it is covered from the environment of the docking station and at least one uncovered state in which it is not covered from the environment of the docking station so that the surface measuring apparatus, when accommodated in the docking station and the at least one reference measuring surface is in the at least one uncovered state, can perform a reference measurement of the at least one reference measuring surface.
Specification