Method and System for Testing Time Parameters of Adaptor

• US 20200132755A1
• Filed: 12/30/2019
• Published: 04/30/2020
• Est. Priority Date: 09/30/2018
• Status: Active Grant

• Current Assignee: Guangdong OPPO Mobile Telecommunications Corporation Limited
• Original Assignee: Guangdong OPPO Mobile Telecommunications Corporation Limited
• Inventors: Tian, Chen
• Granted Patent: US 11,614,484 B2
• Time in Patent Office: Days
• CPC Class Codes: G01R 19/0092 measuring current only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 31/2882 Testing timing characteristics
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10
• CPC Class Codes: H02J 2207/30 Charge provided using DC bus or data bus of a computer
• CPC Class Codes: H02J 7/00036 Charger exchanging data with battery
• CPC Class Codes: H02J 7/00045 Authentication, i.e. circuits for checking compatibility between one component, e.g. a battery or a battery charger, and another component, e.g. a power source

Abstract

Provided are methods and systems for testing time parameters of an adaptor and systems. The method includes the following. After a testing system is coupled with an adaptor, a clock signal is received from the adaptor, where the clock signal is indicative of the transmission time of the instruction. A first valid interrupt of the clock signal, a square wave corresponding to the first valid interrupt, and a next valid interrupt of the first valid interrupt are acquired. A first falling edge and a first rising edge of the first valid interrupt, a second falling edge of the square wave, and a third falling edge of the next valid interrupt are acquired. A test result time parameters of the adaptor is generated according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge.

Claims

1. A method for testing time parameters of an adaptor, comprising:

receiving a clock signal from an adaptor after being coupled with the adaptor;

acquiring a first valid interrupt of the clock signal, a square wave corresponding to the first valid interrupt, and a next valid interrupt of the first valid interrupt;

acquiring a first falling edge and a first rising edge of the first valid interrupt, a second falling edge of the square wave, and a third falling edge of the next valid interrupt; and

generating a test result of time parameters of the adaptor according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge.

2. The method of claim 1, wherein generating the test result of the time parameters of the adaptor according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge comprises:

determining an interrupt duration according to the first falling edge and the first rising edge;

determining a transmission duration according to the first falling edge and the second falling edge;

determining an interval according to the second falling edge and the third falling edge; and

determining the test result according to the interrupt duration, the transmission duration, and the interval.

3. The method of claim 2, further comprising:

before determining the test result according to the interrupt duration, the transmission duration, and the interval,

acquiring a preset threshold interrupt duration, a preset threshold transmission duration, and a preset threshold interval, wherein the preset threshold interrupt duration, the preset threshold transmission duration, and the preset threshold interval are indicative of timing requirements of the adaptor.

4. The method of claim 3, wherein determining the test result according to the interrupt duration, the transmission duration, and the interval comprises:

obtaining a first result according to the interrupt duration and the preset threshold interrupt duration;

obtaining a second result according to the transmission duration and the preset threshold transmission duration;

obtaining a third result according to the interval and the preset threshold interval; and

determining the test result according to the first result, the second result, and the third result.

5. The method of claim 4, wherein obtaining the first result according to the interrupt duration and the preset threshold interrupt duration comprises:

determining that the first result is that the time parameters of the adaptor do not meet the timing requirements, in response to the interrupt duration being longer than or equal to the preset threshold interrupt duration; and

determining that the first result is that the time parameters of the adaptor meet the timing requirements, in response to the interrupt duration being shorter than the preset threshold interrupt duration.

6. The method of claim 5, wherein the timing requirements are requirements on a valid interrupt in the clock signal.

7. The method of claim 4, wherein obtaining the second result according to the transmission duration and the preset threshold transmission duration comprises:

determining that the second result is that the time parameters of the adaptor do not meet the timing requirements, in response to the transmission duration being longer than or equal to the preset threshold transmission duration; and

determining that the second result is that the time parameters of the adaptor meet the timing requirements, in response to the transmission duration being shorter than the preset threshold transmission duration.

8. The method of claim 7, wherein the timing requirements are requirements on transmission of one byte from the adaptor to a testing system.

9. The method of claim 4, wherein obtaining the third result according to the interval and the preset threshold interval comprises:

determining that the third result is that the time parameters of the adaptor do not meet the timing requirements, in response to the interval being longer than or equal to the preset threshold interval; and

determining that the third result is that the time parameters of the adaptor meet the timing requirements, in response to the interval being shorter than the preset threshold interval.

10. The method of claim 9, wherein the timing requirements are requirements on time interval at which the adapter sends two consecutive bytes.

11. The method of claim 2, wherein the interrupt duration is indicative of a duration of a valid interrupt in the clock signal, the transmission duration is indicative of time taken for data transmission when the adapter sends an instruction to a testing system according to the clock signal, and the interval is indicative of an interval at which different bytes are sent when sending the instruction.

12. A system for testing time parameters of an adaptor, comprising:

a receiving section configured to receive a clock signal from the adaptor after the testing system is coupled with the adaptor, wherein the clock signal is indicative of a transmission time of an instruction;

an acquiring section configured to;

acquire a first valid interrupt of the clock signal, a square wave corresponding to the first valid interrupt, and a next valid interrupt of the first valid interrupt; and

acquire a first falling edge and a first rising edge of the first valid interrupt, a second falling edge of the square wave, and a third falling edge of the next valid interrupt; and

a generating section configured to generate a test result of time parameters of the adaptor according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge.

13. The system of claim 12, wherein the generating section is configured to:

determine an interrupt duration according to the first falling edge and the first rising edge;

determine a transmission duration according to the first falling edge and the second falling edge;

determine an interval according to the second falling edge and the third falling edge; and

determine the test result according to the interrupt duration, the transmission duration, and the interval.

14. The system of claim 13, wherein the acquiring section is further configured to:

acquire a preset threshold interrupt duration, a preset threshold transmission duration, and a preset threshold interval before the generating section determines the test result according to the interrupt duration, the transmission duration, and the interval, wherein the preset threshold interrupt duration, the preset threshold transmission duration, and the preset threshold interval are indicative of timing requirements of the adaptor.

15. The system of claim 14, wherein

the acquiring section is configured to:

obtain a first result according to the interrupt duration and the preset threshold interrupt duration;

obtain a second result according to the transmission duration and the preset threshold transmission duration; and

obtain a third result according to the interval and the preset threshold interval; and

the generating section is configured to determine the test result according to the first result, the second result, and the third result.

16. The system of claim 15, wherein the generating section is further configured to:

determine that the first result is that the time parameters of the adaptor does not meet the timing requirements, in response to the interrupt duration being longer than or equal to the preset threshold interrupt duration;

determine that the first result is that the time parameters of the adaptor meets the timing requirements, in response to the interrupt duration being shorter than the preset threshold interrupt duration;

determine that the second result is that the time parameters of the adaptor does not meet the timing requirements, in response to the transmission duration being longer than or equal to the preset threshold transmission duration;

determine that the second result is that the time parameters of the adaptor meets the timing requirements, in response to the transmission duration being shorter than the preset threshold transmission duration;

determine that the third result is that the time parameters of the adaptor does not meet the timing requirements, in response to the interval being longer than or equal to the preset threshold interval; and

determine that the third result is that the time parameters of the adaptor meets the timing requirements, in response to the interval being shorter than the preset threshold interval.

17. A system for testing time parameters of an adaptor, comprising a testing board, a host computer, and an electronic load, and at least one of the testing board and the host computer being integrated with a processor and a memory configured to store instructions which, when executed by the processor, are operable with the processor to:

receive a clock signal from an adaptor after the testing system being coupled with the adaptor;

acquire a first valid interrupt of the clock signal, a square wave corresponding to the first valid interrupt, and a next valid interrupt of the first valid interrupt;

acquire a first falling edge and a first rising edge of the first valid interrupt, a second falling edge of the square wave, and a third falling edge of the next valid interrupt; and

generate a test result of time parameters of the adaptor according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge.

18. The system of claim 17, wherein the instructions operable with the processor to generate the test result are operable with the processor to:

determine an interrupt duration according to the first falling edge and the first rising edge, wherein the interrupt duration is indicative of a duration of a valid interrupt in the clock signal;

determine a transmission duration according to the first falling edge and the second falling edge, wherein the transmission duration is indicative of time taken for data transmission when the adapter sends an instruction to the testing system according to the clock signal;

or

determine an interval according to the second falling edge and the third falling edge, wherein the interval is indicative of an interval at which different bytes are sent when sending the instruction; and

determine the test result according to at least one of;

the interrupt duration, the transmission duration, or the interval.

19. The system of claim 18, wherein the instructions operable with the processor to determine the test result are operable with the processor to:

determine whether the time parameters of the adapter meet timing requirements on a valid interrupt in the clock signal, according to comparison between the interrupt duration and a preset threshold interrupt duration;

determine whether the time parameters of the adapter meet timing requirements on transmission of one byte from the adaptor to the testing system, according to comparison between the transmission duration and a preset threshold transmission duration;

or

determine whether the time parameters of the adapter meet timing requirements on time interval at which the adapter sends two consecutive bytes, according to comparison between the interval and a preset threshold interval.

20. The system of claim 19, wherein the instructions operable with the processor to determine the test result are operable with the processor to:

determine that the time parameters of the adapter meet timing requirements, in response to the interrupt duration being shorter than the preset threshold interrupt duration, the transmission duration being shorter than the preset threshold transmission duration, or the interval being shorter than the preset threshold interval.