Inter-Domain Power Element Testing Using Scan
First Claim
1. A system configured to test an inter-domain device that is positioned in a signal path between a first output wrapper device in a first module and a first input wrapper device in a second module, the system comprising:
- an output scan chain comprising the first output wrapper device;
an input scan chain comprising the first input wrapper device; and
a controller configured to;
provide an output scan enable signal to the output scan chain to cause test data to be stored in the first output wrapper device;
capture, with the first input wrapper device, inter-domain device data that is output by the inter-domain device;
provide an input scan enable signal to the input scan chain to cause the inter-domain device data to be output by an output scan chain serial output;
determine whether the inter-domain device data indicates that the inter-domain device is defective; and
provide a defect signal in response to determining that the inter-domain device is defective.
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Accused Products
Abstract
Systems, methods, and circuitries are disclosed to test an inter-domain device that is positioned in a signal path between a first output wrapper device in a first module and a first input wrapper device in a second module. In one example, a testing system includes an output scan chain that includes the first output wrapper device and an input scan chain that includes the first input wrapper device. A controller is configured to: provide an output scan enable signal to the output scan chain to cause test data to be stored in the first output wrapper device; capture, with the first input wrapper device, inter-domain device data output; provide an input scan enable signal to the input scan chain to cause the inter-domain device data to be output by an output scan chain serial output; and determine whether the inter-domain device data indicates that the inter-domain device is defective.
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Citations
20 Claims
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1. A system configured to test an inter-domain device that is positioned in a signal path between a first output wrapper device in a first module and a first input wrapper device in a second module, the system comprising:
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an output scan chain comprising the first output wrapper device; an input scan chain comprising the first input wrapper device; and a controller configured to; provide an output scan enable signal to the output scan chain to cause test data to be stored in the first output wrapper device; capture, with the first input wrapper device, inter-domain device data that is output by the inter-domain device; provide an input scan enable signal to the input scan chain to cause the inter-domain device data to be output by an output scan chain serial output; determine whether the inter-domain device data indicates that the inter-domain device is defective; and provide a defect signal in response to determining that the inter-domain device is defective. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method configured to test an inter-domain device that is positioned in a signal path between a first output wrapper device in a first module and a first input wrapper device in a second module, the method comprising:
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providing an output scan chain comprising the first output wrapper device; providing an input scan chain comprising the first input wrapper device; and providing an output scan enable signal to the output scan chain to cause test data to be stored in the first output wrapper device; capturing, with the first input wrapper device, inter-domain device data that is output by the inter-domain device; providing an input scan enable signal to the input scan chain to cause the inter-domain device data to be output by an output scan chain serial output; determining whether the inter-domain device data indicates that the inter-domain device is defective; and providing a defect signal in response to determining that the inter-domain device is defective. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. Non-transitory computer-readable medium having computer-executable instructions stored thereon that, when executed by a processor cause the processor to perform corresponding functions, the functions comprising:
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providing an output scan enable signal to an output scan chain to cause test data to be stored in a first output wrapper device; providing an input scan enable signal to the input scan chain to cause inter-domain device data to be output by an output scan chain serial output; determining whether the inter-domain device data indicates that the inter-domain device is defective; and providing a defect signal in response to determining that the inter-domain device is defective. - View Dependent Claims (18, 19, 20)
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Specification