TEST APPARATUS
First Claim
1. A method of testing a plurality of devices under test (DUTs), the method comprising:
- determining, by a test apparatus in a training mode, a first delay of up to a unit interval;
determining, by the test apparatus in the training mode, a second delay corresponding to an integer multiple of the predetermined unit interval;
delaying, by the test apparatus in an operation mode, a data signal by the second delay to produce a delayed data signal; and
delaying, by the test apparatus in the operation mode, the delayed data signal by the first delay to produce a compensated data signal.
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Accused Products
Abstract
A test apparatus may include transceivers and a global de-skew circuit. In a training mode, the transceivers provide first timing information obtained by delaying a first data signal in the range of up to a preset unit interval based on a clock signal and receive second timing information corresponding to timing differences between a slowest transceiver and the remaining transceivers. In an operation mode, the transceivers provide compensation data to a plurality of DUTs (Devices Under Test) substantially simultaneously. The compensation data may be obtained by delaying a second data signal by multiples of the preset unit interval in response to the second timing information. In the training mode, the global de-skew circuit receives the first timing information, calculates, using the first timing information, the timing differences between the slowest transceiver and the remaining transceivers , and provides the second timing information corresponding to the timing differences to the transceivers.
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Citations
5 Claims
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1. A method of testing a plurality of devices under test (DUTs), the method comprising:
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determining, by a test apparatus in a training mode, a first delay of up to a unit interval; determining, by the test apparatus in the training mode, a second delay corresponding to an integer multiple of the predetermined unit interval; delaying, by the test apparatus in an operation mode, a data signal by the second delay to produce a delayed data signal; and delaying, by the test apparatus in the operation mode, the delayed data signal by the first delay to produce a compensated data signal. - View Dependent Claims (2, 3, 4, 5)
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Specification