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TEST APPARATUS

  • US 20200132765A1
  • Filed: 01/02/2020
  • Published: 04/30/2020
  • Est. Priority Date: 12/07/2016
  • Status: Active Grant
First Claim
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1. A method of testing a plurality of devices under test (DUTs), the method comprising:

  • determining, by a test apparatus in a training mode, a first delay of up to a unit interval;

    determining, by the test apparatus in the training mode, a second delay corresponding to an integer multiple of the predetermined unit interval;

    delaying, by the test apparatus in an operation mode, a data signal by the second delay to produce a delayed data signal; and

    delaying, by the test apparatus in the operation mode, the delayed data signal by the first delay to produce a compensated data signal.

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