Image Sensor with Interleaved Hold for Single-Readout Depth Measurement

• US 20200132819A1
• Filed: 10/31/2018
• Published: 04/30/2020
• Est. Priority Date: 10/31/2018
• Status: Active Grant

• Current Assignee: Infineon Technologies AG
• Original Assignee: Infineon Technologies AG
• Inventors: Dielacher, Markus, Flatscher, Martin, Lobnik, Robert, Unterassinger, Hartwig
• Granted Patent: US 11,506,763 B2
• Time in Patent Office: Days
• CPC Class Codes: G01S 17/10 using transmission of interrupted, pulse-modulated waves determination of distance by phase measurements G01S17/32
• CPC Class Codes: G01S 17/36 with phase comparison between the received signal and the contemporaneously transmitted signal
• CPC Class Codes: G01S 17/894 3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
• CPC Class Codes: G01S 7/4863 Detector arrays, e.g. charge-transfer gates
• CPC Class Codes: G01S 7/4865 Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak peak detection in noise, signal conditioning G01S7/487
• CPC Class Codes: G01S 7/4914 of detector arrays, e.g. charge-transfer gates

Abstract

Time-of-flight (TOF) systems and techniques whereby a first exposure obtains pixel measurements for a first subset of pixels of a pixel array, using a first reference signal. For a second exposure, the first subset of the pixels, e.g., every second line of the pixel array, are set to a “hold” state, so that values obtained from the first measurement are maintained. A second exposure using a second reference signal is performed for a second subset of the pixels. The first and second reference signals may have different phase shifts relative to a signal modulating an optical signal being measured. The result is an array of pixels in which the first and second subsets hold results of the first and second exposures, respectively. These pixel values can then be read out all at once, with certain calculations being performed directly as pixel values are read from the pixel array.

Claims

1. A method for processing pixel signal values from an image sensor having a plurality of pixels, each pixel being configured to generate a respective pixel signal value by demodulating received light using a reference signal, the method comprising:

controlling at least a first subset of the plurality of pixels to generate respective pixel signal values, based on a first reference signal applied to the first subset of pixels, for a first exposure;

subsequent to the first exposure, controlling the first subset of the plurality of pixels to hold their respective pixel signal values;

while the first subset of the plurality of pixels are holding their respective pixel signal values, controlling a second subset of the plurality of pixels to generate respective pixel signal values, based on a second reference signal applied to the second subset of pixels, for a second exposure;

subsequent to the second exposure, controlling the second subset of the plurality of pixels to hold their respective pixel signal values; and

reading out the pixel signal values from the first and second subsets of the plurality of pixels and converting the read pixel signal values to digital pixel values.

2. The method of claim 1, wherein the plurality of pixels are arranged in an array having lines and columns, and wherein the first subset of pixels comprises pixels in every odd or even line of the array and the second subset of pixels comprises the remaining pixels.

3. The method of claim 1, wherein the method further comprises generating depth values for a depth map by combining, for each depth value, a digital pixel value for a pixel of the first subset with a digital pixel value for a corresponding pixel of the second subset.

4. The method of claim 3, wherein the plurality of pixels are arranged in an array having lines and columns, the first subset of pixels comprising pixels in every odd or even line of the array and the second subset of pixels comprising the remaining pixels, and wherein said combining comprises, for each depth value, combining a digital pixel value for a pixel in any given line with the digital pixel value for the neighboring pixel in an immediately adjacent line.

5. The method of claim 1, wherein the first reference signal has a first phase, relative to a modulating signal applied, during the first exposure, to an optical signal being measured by the image sensor, and the second reference signal has a second phase, relative to the modulating signal applied, during the second exposure, to the optical signal being measured by the image sensor.

6. The method of claim 5, wherein the difference between the first phase and the second phase is 90 degrees and wherein said combining comprises computing an arctangent of a ratio of the digital pixel values for the pixels.

7. An image processing system comprising:

a sensor comprising a plurality of pixels configured to generate a respective plurality of pixel signal values in response to received light, wherein each pixel is configured to obtain its respective pixel signal value by demodulating received light using a reference signal;

a reference signal generator configured to generate the reference signal and to provide the reference signal to the plurality of pixels, and

an analog-to-digital converter (ADC) circuit operatively coupled to the plurality of pixels, and

control circuitry configured to;

control the reference signal generator to generate a first reference signal;

control at least a first subset of the plurality of pixels to generate respective pixel signal values, based on the first reference signal, for a first exposure;

subsequent to the first exposure, control the first subset of the plurality of pixels to hold their respective pixel signal values;

control the reference signal generator to generate a second reference signal, while the first subset of the plurality of pixels are holding their respective pixel signal values;

while the first subset of the plurality of pixels are holding their respective pixel signal values, control a second subset of the plurality of pixels to generate respective pixel signal values, based on the second reference signal, for a second exposure;

subsequent to the second exposure, control the second subset of the plurality of pixels to hold their respective pixel signal values; and

,

read out the pixel signal values of the first and second subsets of pixels, for conversion to respective digital pixel values by the ADC circuit.

8. The image processing system of claim 7, wherein the plurality of pixels are arranged in an array having lines and columns, and wherein the first subset of pixels comprises pixels in every odd or even line of the array and the second subset of pixels comprises the remaining pixels.

9. The image processing system of claim 7, wherein the image processing system further comprises calculating logic configured to generate depth values for a depth map by combining, for each depth value, a digital pixel value for a pixel of the first subset with a digital pixel value for a corresponding pixel of the second subset.

10. The image processing system of claim 9, wherein the plurality of pixels are arranged in an array having lines and columns, the first subset of pixels comprising pixels in every odd or even line of the array and the second subset of pixels comprising the remaining pixels, and wherein the calculating logic is configured to, for each depth value, combine a digital pixel value for a pixel in any given line with the digital pixel value for the neighboring pixel in an immediately adjacent line.

11. The image processing system of claim 7, wherein the control circuitry is configured to generate the first reference signal so that it has a first phase, relative to a modulating signal applied, during the first exposure, to an optical signal being measured by the image sensor, and to generate the second reference signal so that it has a second phase, relative to the modulating signal applied, during the second exposure, to the optical signal being measured by the image sensor.

12. The image processing of claim 11, wherein the control circuitry is configured to generate the second reference signal to have the second phase, during the second exposure, by introducing a phase shift to an input reference signal, between the first and second exposures.

13. The image processing system of claim 11, wherein the difference between the first phase and the second phase is 90 degrees and wherein the calculating logic is configured to combine digital pixel values by computing an arctangent of a ratio of the digital pixel values for the pixels.

14. The image processing system of claim 11, further comprising a memory operatively coupled to the ADC circuit and configured to store digital pixel values for one line of the array at a time, wherein the calculating logic is configured to compute each arctangent using a digital pixel value stored in the memory and a corresponding digital pixel value for the neighboring pixel in the immediately adjacent line.