LITHOGRAPHY METHOD
First Claim
Patent Images
1. A method, comprising:
- acquiring a reference image of a mask having a plurality of mapping marks; and
performing, by a scanner, a lithography exposing process with the mask to a photoresist layer which is formed on a substrate, wherein performing the lithography exposing process comprises mapping a real-time image of the mask with the reference image of the mask, wherein mapping the real-time image of the mask with the reference image of the mask comprises;
capturing the real-time image of the mask having the plurality of mapping marks; and
mapping first mark images of the plurality of mapping marks in the real-time image with second mark images of the plurality of mapping marks in the reference image, respectively.
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Abstract
A method includes the following operations. A reference image of a mask having a plurality of mapping marks is acquired. A lithography exposing process is performed by a scanner with the mask to a photoresist layer which is formed on a substrate. Performing the lithography exposing process includes mapping a real-time image of the mask with the reference image of the mask.
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Citations
22 Claims
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1. A method, comprising:
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acquiring a reference image of a mask having a plurality of mapping marks; and performing, by a scanner, a lithography exposing process with the mask to a photoresist layer which is formed on a substrate, wherein performing the lithography exposing process comprises mapping a real-time image of the mask with the reference image of the mask, wherein mapping the real-time image of the mask with the reference image of the mask comprises; capturing the real-time image of the mask having the plurality of mapping marks; and mapping first mark images of the plurality of mapping marks in the real-time image with second mark images of the plurality of mapping marks in the reference image, respectively. - View Dependent Claims (2, 3, 5, 6, 7, 8, 9)
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4. (canceled)
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10. A method, comprising:
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acquiring a reference image of a mask, wherein the reference image includes first images of a plurality of mapping marks on the mask; mapping, by a scanner, the reference image of the mask with a real-time image of the mask in a lithography process; and adjusting a position of the mask with respect to a substrate in the lithography process based on the mapping operation, wherein mapping the reference image with the real-time image comprises; capturing the real-time image of the mask, wherein the real-time image comprises the plurality of mapping marks on the mask; and mapping the plurality of mapping marks of the real-time image with the plurality of mapping marks of the reference image respectively to calculate a displacement between the reference image and the real-time image. - View Dependent Claims (11, 13, 14, 15, 16)
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12. (canceled)
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17. A method, comprising:
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performing a lithography process with a mask to form a pattern of the mask on a substrate, wherein performing the lithography process comprises; aligning a position of the mask with a position of the substrate in the lithography process; and mapping a reference image of the mask with a real-time image of the mask based on a plurality of mapping marks on the mask in order to adjust an offset between the reference image and the real-time image, wherein the reference image has the plurality of mapping marks on the mask wherein mapping the reference image of the mask with the real-time image of the mask comprises; capturing the real-time image of the mask, wherein the real-time image has the plurality of mapping marks on the mask; and mapping the plurality of mapping marks of the real-time image with the plurality of mapping marks of the reference image, respectively. - View Dependent Claims (18, 19, 20, 21, 22)
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Specification