SINGLE-LAYER SENSOR ARRAY SCAN
First Claim
1. An input device comprising:
- a sensor array comprising a plurality of sensor electrodes in a single layer of the input device, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes;
a plurality of routing traces arranged in the single layer; and
a processing system coupled with the plurality of sensor electrodes via the plurality of routing traces, the processing system configured to perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to;
acquire, during a first period, an absolute capacitive measurement for the sensor electrode; and
for each bordering sensor electrode of the one or more bordering sensor electrodes;
acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode.
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Accused Products
Abstract
A method of performing a scan of a sensor array is disclosed, as well as an associated processing system and input device. The sensor array comprises a plurality of sensor electrodes in a single layer. A plurality of routing traces is arranged in the single layer. The method comprises, for each sensor electrode of the plurality of sensor electrodes, acquiring, during a first period, an absolute capacitive measurement for the sensor electrode. The method further comprises, for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes, acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode.
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Citations
20 Claims
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1. An input device comprising:
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a sensor array comprising a plurality of sensor electrodes in a single layer of the input device, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes; a plurality of routing traces arranged in the single layer; and a processing system coupled with the plurality of sensor electrodes via the plurality of routing traces, the processing system configured to perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to; acquire, during a first period, an absolute capacitive measurement for the sensor electrode; and for each bordering sensor electrode of the one or more bordering sensor electrodes; acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A processing system comprising:
sensing circuitry configured to; couple with a sensor array via a plurality of routing traces, wherein the sensor array comprises a plurality of sensor electrodes in a single layer, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes, wherein the plurality of routing traces is arranged in the single layer; and perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to; acquire, during a first period, an absolute capacitive measurement for the sensor electrode; and for each bordering sensor electrode of the one or more bordering sensor electrodes; acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode. - View Dependent Claims (11, 12, 13, 15, 16, 17)
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14. The processing system of claim 14, wherein the sensing circuitry is further configured to, according to the predefined sequence:
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drive third sensor electrodes of the plurality of sensor electrodes with a modulated signal during a third sub-period of the second period, wherein the first sensor electrodes are contiguous along a first axis of the sensor array, wherein the second sensor electrodes are contiguous along a second axis of the sensor array, wherein the third sensor electrodes comprise alternating sensor electrodes of the sensor array, and wherein the one or more matrix operations comprise at least one of matrix addition or matrix subtraction.
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18. A method of performing a scan of a sensor array of an input device, the sensor array comprising a plurality of sensor electrodes in a single layer of the input device, the input device further comprising a plurality of routing traces arranged in the single layer, the method comprising:
for each sensor electrode of the plurality of sensor electrodes; acquiring, during a first period, an absolute capacitive measurement for the sensor electrode; and for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes; acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode. - View Dependent Claims (19, 20)
Specification