SYSTEM ON CHIP PERFORMING A PLURALITY OF TRAININGS AT THE SAME TIME, OPERATING METHOD OF SYSTEM ON CHIP, ELECTRONIC DEVICE INCLUDING SYSTEM ON CHIP

• US 20200133542A1
• Filed: 06/28/2019
• Published: 04/30/2020
• Est. Priority Date: 10/30/2018
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: KIM, Yongseob, SEO, Minho
• Granted Patent: US 11,003,370 B2
• Time in Patent Office: Days
• CPC Class Codes: G06F 3/0604 Improving or facilitating administration, e.g. storage management
• CPC Class Codes: G06F 3/0632 by initialisation or re-initialisation of storage systems
• CPC Class Codes: G06F 3/0653 Monitoring storage devices or systems
• CPC Class Codes: G06F 3/0659 Command handling arrangements, e.g. command buffers, queues, command scheduling
• CPC Class Codes: G06F 3/0673 Single storage device
• CPC Class Codes: G11C 11/4074 Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
• CPC Class Codes: G11C 11/4076 Timing circuits for regeneration management G11C11/406
• CPC Class Codes: G11C 11/4093 Input/output [I/O] data interface arrangements, e.g. data buffers
• CPC Class Codes: G11C 11/4096 Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
• CPC Class Codes: G11C 2207/2254 Calibration
• CPC Class Codes: G11C 7/1066 Output synchronization
• CPC Class Codes: G11C 7/1093 Input synchronization

Abstract

A system on chip includes a clock generator that adjusts a duty cycle of a clock to be output to a memory device depending on a first code, a reference voltage generator that adjusts a level of a reference voltage used to determine a first data input/output signal output from the memory device depending on a second code, a data receiver that aligns a first data strobe signal and the first data input/output signal output from the memory device, when one of the first code and the second code is changed, and a training circuit that calculates a plurality of read valid window margins for a plurality of combinations of the first code and the second code based on the first data strobe signal and the first data input/output signal.

Claims

1. A system on chip comprising:

a clock generator configured to adjust a duty cycle of a clock to be output to a memory device depending on a first code;

a reference voltage generator configured to adjust a first level of a first reference voltage used to determine a first data input/output signal output from the memory device depending on a second code;

a data receiver configured to align a first data strobe signal and the first data input/output signal output from the memory device, when one of the first code and the second code is changed; and

a processor configured to calculate a plurality of read valid window margins for a plurality of combinations of the first code and the second code based on the first data strobe signal and the first data input/output signal.

2. The system on chip of claim 1, wherein each of the plurality of combinations is a pair of one of values of the first code and one of values of the second code.

3. The system on chip of claim 2, wherein the processor is further configured to

determine whether the first data strobe signal and the first data input/output signal output from the memory device depending on a first value of the first code and a second value of the second code are aligned by the data receiver, and

calculate one of the plurality of read valid window margins corresponding to a pair of the first value and the second value in response to the determination.

4. The system on chip of claim 1, wherein

the duty cycle of the clock and the first level of the first reference voltage are respectively set according to a first target value of the first code and a second target value of the second code, wherein

the first target value of the first code and the second target value of the second code correspond to a maximum read valid window margin of the plurality of read valid window margins.

5. The system on chip of claim 4, wherein the data receiver is further configured to again align the first data strobe signal and the first data input/output signal output from the memory device at the duty cycle of the clock corresponding to the first target value and the first level of the first reference voltage corresponding to the second target value.

6. The system on chip of claim 4, further comprising:

a data transmitter configured to send a second data strobe signal and a second data input/output signal to the memory device through paths where the first data strobe signal and the first data input/output signal are respectively sent from the memory device to the data receiver.

7. The system on chip of claim 6, wherein the processor is further configured to generate a command for adjusting a second level of a second reference voltage of the memory device used to determine the second data input/output signal, after the duty cycle of the clock and the level of the reference voltage are respectively set according to the first target value and the second target value.

8. The system on chip of claim 7, wherein

the second level of the second reference voltage of the memory device is adjusted according to a third code, the third code being transmitted to the memory device together with the command,

the data transmitter is further configured to align the second data strobe signal and the second data input/output signal to be output to the memory device, in response to the third code being changed, and

the processor is further configured to calculate a plurality of write valid window margins for the third code based on the first data strobe signal and the first data input/output signal.

9. The system on chip of claim 8, wherein the reference voltage generator is further configured to set the second level of the second reference voltage of the memory device according to a third target value of the third code corresponding to a maximum write valid window margin of the plurality of write valid window margins.

10. The system on chip of claim 9, wherein the data transmitter is further configured to again align the second data strobe signal and the second data input/output signal to be output to the memory device at the second level of the second reference voltage of the memory device.

11. An operating method of a system on chip connected with a memory device, the method comprising:

changing one of a first code for adjusting a duty cycle of a clock to be provided to the memory device and a second code for adjusting a first level of a first reference voltage of the system on chip used to determine a first data input/output signal output from the memory device;

aligning a first data strobe signal and the first data input/output signal output from the memory device;

calculating a plurality of read valid window margins for a plurality of combinations, each one of the plurality of combinations being a pair of one of values of the first code and one of values of the second code, based on the first data strobe signal and the first data input/output signal; and

setting the duty cycle of the clock and the first level of the first reference voltage of the system on chip, respectively, based on a first target value of the first code and a second target value of the second code corresponding to a maximum read valid window margin of the plurality of read valid window margins.

12. The method of claim 11, wherein the changing of the one of the first code and the second code includes:

changing the first code to a first value and repeatedly changing the second code while maintaining the first code at the first value; and

changing the first code from the first value to a second value and repeatedly changing the second code while maintaining the first code at the second value.

13. The method of claim 11, wherein the changing of the one of the first code and the second code includes

changing the second code to a first value and repeatedly changing the first code while maintaining the second code at the first value, and

changing the second code from the first value to a second value and repeatedly changing the first code while maintaining the second code at the second value.

14. The method of claim 11, further comprising

setting a third code for adjusting a second level of a second reference voltage of the memory device,

changing the third code and aligning a second data strobe signal and a second data input/output signal to be output to the memory device,

calculating a plurality of write valid window margins for the third code based on the first data strobe signal and the first data input/output signal, and

setting the second level of the second reference voltage of the memory device depending on a third target value of the third code corresponding to a maximum write valid window margin of the plurality of write valid window margins.

15. The method of claim 14, wherein, after the duty cycle of the clock and the first level of the first reference voltage of the system on chip are respectively set according to the first target value of the first code and the second target value of the second code, the second level of the second reference voltage of the memory device is set according to third target value of the third code.

16. An electronic device comprising:

a system on chip configured to generate a clock; and

a memory device synchronized with an output from the clock,

wherein the system on chip is further configured to simultaneously perform

a first training of a duty cycle of the clock adjusted according to a first code,

a second training of a first level of a first reference voltage of the system on chip which is adjusted according to a second code and is used to determine a first data input/output signal output from the memory device, and

a third training of a first skew between a first data strobe signal and the first data input/output signal output from the memory device.

17. The electronic device of claim 16, wherein the system on chip is further configured to

change one of the first code and the second code,

align the first data strobe signal and the first data input/output signal,

calculate a plurality of read valid window margins for a plurality of combinations of the first code and the second code, and

set the duty cycle of the clock and the first level of the first reference voltage of the system on chip respectively based on a first target value of the first code and a second target value of the second code, the first target value and the second target value corresponding to a maximum read valid window margin of the plurality of read valid window margins.

18. The electronic device of claim 16, wherein the system on chip is further configured to simultaneously perform

a third training of a second level of a second reference voltage of the memory device, the second level of the second reference voltage being adjusted according to a third code and being used to determine a second data input/output signal output from the system on chip, and

a fourth training of a second skew between a second data strobe signal and the second data input/output signal to be output to the memory device.

19. The electronic device of claim 18, wherein the system on chip is further configured to

change the third code,

align the second data strobe signal and the second data input/output signal,

calculate a plurality of write valid window margins for the third code based on the first data strobe signal and the first data input/output signal, and

set the second level of the second reference voltage of the memory device depending on a third target value of the third code.

20. The electronic device of claim 18, wherein the memory device is a dynamic random access memory (DRAM) device, and

the system on chip is further configured to generate a mode register write command which stores a third target value to a mode register of the memory device.