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TEST PATTERN GENERATION SYSTEMS AND METHODS

  • US 20200134131A1
  • Filed: 09/03/2019
  • Published: 04/30/2020
  • Est. Priority Date: 10/31/2018
  • Status: Active Grant
First Claim
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1. A test pattern generation system, comprising:

  • test pattern generation circuitry, which, when in use;

    receives a noise image;

    generates a pattern image based on the noise image; and

    generates a test pattern based on the pattern image, the test pattern being representative of geometric shapes of an electronic device design layout that is free of design rule check (DRC) violations.

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