Power and Temperature Management for Functional Blocks Implemented by a 3D Stacked Integrated Circuit
First Claim
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1. A three-dimensional stacked integrated circuit (3D SIC), comprising:
- a non-volatile memory die;
a volatile memory die;
a logic die; and
a thermal management component having a different thermal conductivity than the dies,wherein the non-volatile memory die, the volatile memory die, the logic die, and the thermal management component are stacked,wherein the thermal management component is stacked in between the non-volatile memory die and the logic die or stacked in between the volatile memory die and the logic die, andwherein the non-volatile memory die, the volatile memory die, and the logic die are arranged to form an array of functional blocks.
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Abstract
A three-dimensional stacked integrated circuit (3D SIC) having a non-volatile memory die, a volatile memory die, a logic die, and a thermal management component. The non-volatile memory die, the volatile memory die, the logic die, and the thermal management component are stacked. The thermal management component can be stacked in between the non-volatile memory die and the logic die, stacked in between the volatile memory die and the logic die, or both.
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Citations
20 Claims
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1. A three-dimensional stacked integrated circuit (3D SIC), comprising:
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a non-volatile memory die; a volatile memory die; a logic die; and a thermal management component having a different thermal conductivity than the dies, wherein the non-volatile memory die, the volatile memory die, the logic die, and the thermal management component are stacked, wherein the thermal management component is stacked in between the non-volatile memory die and the logic die or stacked in between the volatile memory die and the logic die, and wherein the non-volatile memory die, the volatile memory die, and the logic die are arranged to form an array of functional blocks. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A three-dimensional stacked integrated circuit (3D SIC), comprising:
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a logic die; a 3D XPoint (3DXP) die; a dynamic random-access memory (DRAM) die, wherein the logic die is stacked between the 3DXP die and the DRAM die; a plurality of through silicon vias (TSVs) that interconnect the logic die, the 3DXP die, and the DRAM die and that run through the dies; and a thermal management component that is stacked in between the 3DXP die and the logic die or stacked in between the DRAM die and the logic die, and wherein the thermal management component has a different thermal conductivity than the dies, wherein the 3DXP die, the DRAM die, and the logic die are arranged to form an array of functional blocks.
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20. A three-dimensional stacked integrated circuit (3D SIC), comprising:
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a 3D XPoint (3DXP) die comprising an array of non-volatile memory partitions, wherein each partition of the array of non-volatile memory partitions comprises an array of non-volatile memory cells; a volatile memory die comprising an array of volatile memory partitions, wherein each partition of the array of volatile memory partitions comprises an array of volatile memory cells; a logic die comprising an array of logic partitions, wherein the 3DXP die, the volatile memory die, and the logic die are stacked; a through silicon via (TSV) that connects and runs through a respective non-volatile memory partition, a respective logic partition, and a respective volatile partition in a respective column of the 3D SIC; and a thermal management component that is stacked in between the 3DXP die and the logic die and/or stacked in between the volatile memory die and the logic die, and wherein the thermal management component has a different thermal conductivity than the dies.
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Specification