IMAGING DEVICE WITH UNIFORM PHOTOSENSITVIE REGION ARRAY
First Claim
1. A pixel sensor, comprising:
- a first pair of photodetectors in a semiconductor substrate, wherein the first pair of photodetectors are reflection symmetry with respect to a first line positioned at a midpoint between the first pair of photodetectors;
a second pair of photodetectors in the semiconductor substrate, wherein the first and second pair of photodetectors are reflection symmetric with respect to a second line, wherein the second line intersects the first line at a center point;
a first plurality of transistors disposed over the semiconductor substrate laterally offset the first pair of photodetectors; and
a second plurality of transistors disposed over the semiconductor substrate laterally offset the first plurality of transistors, wherein the first and second pair of photodetectors are laterally between the first and second plurality of transistors;
wherein the first and second plurality of transistors are point symmetric with respect to the center point.
1 Assignment
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Accused Products
Abstract
Various embodiments of the present disclosure are directed towards a pixel sensor including a first and second pair of photodetectors. The pixel sensor includes the first and second pair of photodetectors in a semiconductor substrate. The first pair of photodetectors are reflection symmetric with respect to a first line positioned at a midpoint between the first pair of photodetectors. The second pair of photodetectors are reflection symmetric with respect to a second line that intersects the first line at a center point. A first plurality of transistors overlying the semiconductor substrate laterally offset the first pair of photodetectors. A second plurality of transistors overlying the semiconductor substrate laterally offset the first plurality of transistors. The first and second pair of photodetectors are laterally between the first and second plurality of transistors. The first and second plurality of transistors are point symmetric with respect to the center point.
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Citations
20 Claims
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1. A pixel sensor, comprising:
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a first pair of photodetectors in a semiconductor substrate, wherein the first pair of photodetectors are reflection symmetry with respect to a first line positioned at a midpoint between the first pair of photodetectors; a second pair of photodetectors in the semiconductor substrate, wherein the first and second pair of photodetectors are reflection symmetric with respect to a second line, wherein the second line intersects the first line at a center point; a first plurality of transistors disposed over the semiconductor substrate laterally offset the first pair of photodetectors; and a second plurality of transistors disposed over the semiconductor substrate laterally offset the first plurality of transistors, wherein the first and second pair of photodetectors are laterally between the first and second plurality of transistors; wherein the first and second plurality of transistors are point symmetric with respect to the center point. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An image sensor, comprising:
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a substrate having a front-side and a back-side opposite to the front-side; a pixel region disposed within the substrate and comprising a first set of two photodetectors laterally disposed next to a second set of two photodetectors, the first and second set of two photodetectors are each configured to convert radiation that enters the substrate from the back-side into an electrical signal; a first plurality of transistors over the front-side of the substrate laterally adjacent to the first set of two photodetectors configured to receive the electrical signal from the first set of two photodetectors; a second plurality of transistors over the front-side of the substrate laterally adjacent to the second set of two photodetectors configured to receive the electrical signal from the second set of two photodetectors, wherein the first and second plurality of transistors are on opposite sides of the pixel region; a deep trench isolation structure enclosing an outer perimeter of the first and second plurality of transistors extending from the back-side of the substrate to a position in the substrate; and an interconnect structure comprising a plurality of conductive wires and vias overlying the front-side of the substrate and electrically coupled to the first and second set of two photodetectors and the first and second plurality of transistors; wherein the first and second plurality of transistors and the interconnect structure have rotational symmetry with respect to a center point of the pixel region. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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19. A method for forming a pixel sensor, the method comprising:
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forming a doped well region having a first doping type in a semiconductor substrate; forming a plurality of photodetector collector regions having a second doping type different than the first doping type in the doped well region, wherein a center point of each photodetector collector region is substantially equidistant from a center point of the doped well region; forming a floating diffusion node in the doped well region between the plurality of photodetector collector regions; forming a plurality of pixel device transistors laterally offset the doped well region, wherein the plurality of pixel device transistors are point symmetric with respect to the center point of the doped well region; and forming a plurality of transfer transistors over the plurality of photodetector collector regions, wherein the plurality of transfer transistors and the plurality of photodetector collector regions are reflection symmetric with respect to a substantially straight line intersecting the center point of the doped well region. - View Dependent Claims (20)
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Specification