ANALOG TO DIGITAL CONVERTER WITH INVERTER BASED AMPLIFIER

• US 20200136639A1
• Filed: 07/26/2019
• Published: 04/30/2020
• Est. Priority Date: 10/31/2018
• Status: Active Grant

• Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Original Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Inventors: Kinyua, Martin
• Granted Patent: US 10,979,064 B2
• Time in Patent Office: Days
• CPC Class Codes: H03F 2203/30051 the SEPP amplifying transistors are composed of multiple coupled transistors
• CPC Class Codes: H03F 2203/45134 the whole differential amplifier together with other coupled stages being fully differential realised
• CPC Class Codes: H03F 3/3028 with symmetrical driving of the end stage
• CPC Class Codes: H03F 3/45237 Complementary long tailed pairs having parallel inputs and being supplied in series
• CPC Class Codes: H03F 3/45269 Complementary non-cross coupled types
• CPC Class Codes: H03F 3/45273 Mirror types
• CPC Class Codes: H03F 3/4565 Controlling the common source circuit of the differential amplifier
• CPC Class Codes: H03M 1/069 by range overlap between successive stages or steps
• CPC Class Codes: H03M 1/1245 Details of sampling arrangements or methods
• CPC Class Codes: H03M 1/164 the steps being performed sequentially in series-connected stages H03M1/161 takes precedence
• CPC Class Codes: H03M 1/462 Details of the control circuitry, e.g. of the successive approximation register
• CPC Class Codes: H03M 1/468 in which the input S/H circuit is merged with the feedback DAC array

Abstract

An analog-to-digital converter (“ADC”) includes an input terminal configured to receive an analog input voltage signal. A first ADC stage is coupled to the input terminal and is configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal. An inverter based residue amplifier is configured to receive the first analog residue signal, amplify the first analog residue signal, and output an amplified residue signal. The amplified residue signal is converted to a second digital value, and the first and second digital values are combined to create a digital output signal corresponding to the analog input voltage signal.

Claims

1. An analog-to-digital converter (“

ADC”

), comprising;

an input terminal configured to receive an analog input voltage signal;

a first ADC stage coupled to the input terminal and configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal;

a first inverter based residue amplifier configured to receive the first analog residue signal, amplify the first analog residue signal, and output a first amplified residue signal;

a second ADC stage configured to receive the first amplified residue signal and output a second digital value corresponding to the first amplified analog residue signal and output a second analog residue signal corresponding to a difference between the second digital value and the first amplified analog residue signal;

a second inverter based residue amplifier configured to receive the second analog residue signal, amplify the second analog residue signal, and output a second amplified residue signal;

a third ADC stage configured to receive the second amplified residue signal and output a third digital value corresponding to the second amplified analog residue signal; and

a controller coupled to the first, second and third ADC stages and configured to combine the first, second and third digital values into a digital output signal representing the analog input voltage signal.

2. The ADC of claim 1, wherein the first ADC stage includes a successive approximation register (SAR) ADC configured to convert the analog input voltage signal to the first digital value.

3. The ADC of claim 2, wherein the SAR ADC includes a sample and hold circuit comprising an array of binary weighted capacitors configured to sample the analog input voltage.

4. The ADC of claim 1, wherein the first ADC stage includes a digital-to-analog converter (DAC) configured to receive the first analog input voltage signal and the first digital value, and output the first analog residue signal.

5. The ADC of claim 1, wherein the first ADC stage is configured to sample the analog input voltage signal during a first operation phase, convert the analog input voltage signal to the first digital value during a second operation phase, and hold the first analog residue signal during a third operation phase.

6. The ADC of claim 5, wherein the first residue amplifier is disabled during the first operation phase, is reset during the second operation phase, and is configured to amplify the first analog residue signal during the third operation phase.

7. The ADC of claim 6, wherein the second ADC stage is configured to sample the amplified first analog residue signal during the third operation phase, and convert the analog input voltage signal during a first operation phase, and convert the amplified first analog residue signal to the second digital value during the first and second operation phases.

8. The ADC of claim 6, wherein the inverter based amplifier includes a first amplifier stage connected between a first voltage supply terminal and a ground terminal, the first amplifier stage comprising:

a first inverter having a residue input terminal configured to receive the analog residue signal; and

an enable terminal configured to receive an enable signal to disable the residue amplifier during the first operation phase.

9. The ADC of claim 8, wherein the inverter based amplifier comprises:

a second amplifier stage including a first inverter connected between the first voltage supply terminal and the ground terminal and receiving an output of the first amplifier stage, and a second inverter connected between the first voltage supply terminal and the ground terminal and receiving the output of the first amplifier stage;

a third amplifier stage including an inverter connected between the first voltage supply terminal and the ground terminal and receiving an output of the second amplifier stage;

wherein the second amplifier stage is configured to selectively create a dead zone in the third amplifier stage.

10. An analog-to-digital converter (“

ADC”

), comprising;

an input terminal configured to receive an analog input voltage signal;

a first ADC stage coupled to the input terminal and configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal;

a first inverter based residue amplifier configured to receive the first analog residue signal, amplify the first analog residue signal, and output a first amplified residue signal, wherein the first inverter based residue amplifier includes;

a first amplifier stage having an input inverter coupled between first and second voltage terminals, the first stage inverter configured to receive the first analog residue signal;

a second amplifier stage having first and second inverters coupled between the first and second voltage terminals and configured to receive an output of the first amplifier stage, and corresponding first and second control devices configured to control current flow through the first and second inverters in response to a control signal;

a third amplifier stage including an output inverter coupled between the first and second voltage terminals and configured to receive an output of the second amplifier stage; and

a control circuit coupled to the first and second control devices and configured to generate the control signal.

11. The ADC of claim 10, wherein the first control device is connected between the first inverter and the first voltage terminal, and wherein the second control device is connected between the second inverter and the second voltage terminal.

12. The ADC of claim 10, wherein the first control device comprises a PMOS transistor and the second control device comprises and NMOS transistor, and wherein the first and second control devices are operated in a triode region.

13. The ADC of claim 10, wherein the control circuit is configured to output the control signal at a first voltage level during a first operation phase, a second voltage level during a second operation phase, and a third voltage level between the first and second voltage levels during a third operation phase.

14. The ADC of claim 10, wherein the second amplifier stage is configured to selectively create a dead zone in the third amplifier stage.

15. The ADC of claim 10, wherein the output inverter of the third amplifier stage includes first and second transistors coupled between the first and second voltage terminals, and wherein the third amplifier stage includes first and second control devices coupled to the first and second transistors, respectively, to selectively disconnect the output inverter from the first and second voltage supply terminals.

16. The ADC of claim 15, wherein the first amplifier stage includes an enable transistor configured to selectively enable or disable the first amplifier, and wherein the first and second control devices of the output inverter and the enable transistor are controlled in response to a first operation phase control signal.

17. The ADC of claim 10, further comprising a second ADC stage configured to receive the first amplified residue signal and convert the first amplified residue signal to a second digital value.

18. A method, comprising:

sampling an analog input voltage signal during a first operation phase;

disabling an inverter based residue amplifier during the first operation phase;

converting the analog input voltage signal to a first digital value corresponding to the analog input voltage signal during a second operation phase;

determining a first analog residue signal corresponding to a difference between the first digital value and the analog input signal during the second operation phase;

amplifying the first analog residue signal by the inverter based residue amplifier during a third operation phase;

converting the amplified first analog residue signal to a second digital value corresponding to the amplified first analog residue signal; and

combining the first and second digital values to a digital output signal representing the analog input voltage signal.

19. The method of claim 18, wherein the inverter based residue amplifier includes first, second and third amplifier stages, and wherein the method further comprises selectively creating a dead zone in the third stage.

20. The method of claim 18, wherein the second amplifier stage includes a control transistor operated in a triode region, and wherein the method further comprises generating a control signal for the control transistor, the control signal having a first voltage level during the first operation phase, a second voltage level during the second operation phase, and a third voltage level between the first and second voltage levels during the third operation phase.