SELF-RADIATED LOOPBACK TEST PROCEDURE FOR MILLIMETER WAVE ANTENNAS
First Claim
1. A method of testing a device under test (DUT) performed by the DUT, the method comprising:
- setting the DUT in a simultaneous transmit and receive mode;
receiving a lower frequency radio frequency (RF) signal from a test unit;
up-converting the lower frequency RF signal to a higher frequency RF signal;
transmitting the higher frequency RF signal using a first antenna of the DUT;
receiving the higher frequency RF signal using a second antenna of the DUT;
down-converting the received higher frequency RF signal to a received test RF signal; and
providing the received test RF signal to the test unit.
1 Assignment
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Accused Products
Abstract
Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.
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Citations
30 Claims
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1. A method of testing a device under test (DUT) performed by the DUT, the method comprising:
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setting the DUT in a simultaneous transmit and receive mode; receiving a lower frequency radio frequency (RF) signal from a test unit; up-converting the lower frequency RF signal to a higher frequency RF signal; transmitting the higher frequency RF signal using a first antenna of the DUT; receiving the higher frequency RF signal using a second antenna of the DUT; down-converting the received higher frequency RF signal to a received test RF signal; and providing the received test RF signal to the test unit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method of testing a device under test (DUT) performed by a test unit, the method comprising:
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configuring the DUT to set a simultaneous transmit and receive mode; generating a lower frequency radio frequency (RF) signal, the test unit comprising only lower frequency RF components; providing the lower frequency RF signal to the DUT; receiving a received test RF signal from the DUT; and comparing measurements derived from the received test RF signal to a design specification for the DUT. - View Dependent Claims (15, 16, 17, 18)
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19. A device under test (DUT), comprising:
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a memory; a plurality of antennas coupled to the at least one processor, the plurality of antenna comprising at least a first antenna and a second antenna, wherein a transmit path for the first antenna is electrically independent of a receive path of the second antenna; an up-converter and a down-converter; and at least one processor coupled to the memory, the at least one processor configured to; set the DUT in a simultaneous transmit and receive mode; receive a lower frequency radio frequency (RF) signal from a test unit; up-convert, via the up-converter, the lower frequency RF signal to a higher frequency RF signal; transmit, via the first antenna, the higher frequency RF signal; receive, via the second antenna, the higher frequency RF signal; down-convert, via the down-converter, the received higher frequency RF signal to a received test RF signal; and provide the received test RF signal to the test unit. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26)
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27. A device test system, including a test unit, wherein the test unit comprises:
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a signal generator configured to generate a lower frequency RF signal and to provide the lower frequency radio frequency (RF) signal to a device under test (DUT), the test unit comprising only lower frequency RF components; a signal analyzer configured to receive a received test RF signal from the DUT and to compare measurements from the received test RF signal to a design specification for the DUT; and a fixture for mounting the DUT to the test unit. - View Dependent Claims (28, 29, 30)
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Specification