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Interferometer means for thickness measurements
US 2,518,647 A
Filed
: 01/07/1948
Issued
: 08/15/1950
Est. Priority Date
: 01/07/1948
Status: Expired due to Term
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Current Assignee
Abraham Strickler
,
John H. Teeple
Original Assignee
Abraham Strickler
,
John H. Teeple
Inventors
Teeple, John H.
,
Strickler, Abraham
Application Number
US03/000,874
Time in Patent Office
951 Days
Field of Search
US Class Current
356/504
CPC Class Codes
G01B 11/0691
of objects while moving G01...
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