Low angle x-ray diffraction

• US 2,831,977 A
• Filed: 03/11/1954
• Issued: 04/22/1958
• Est. Priority Date: 03/11/1954
• Status: Expired due to Term

• Current Assignee: Burton L. Henke
• Original Assignee: Burton L. Henke
• Inventors: Henke, Burton L.
• Application Number:
  US03/415,490
• Time in Patent Office: 1,503 Days
• US Class Current: 378/70
• CPC Class Codes: G01N 23/201 by measuring small-angle scattering
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• CPC Class Codes: G21K 1/06 using diffraction, refraction or reflection, e.g. monochromators G21K1/10, G21K7/00 take precedence
• CPC Class Codes: G21K 2201/064 having a curved surface
• CPC Class Codes: H01J 35/00 X-ray tubes

Claims