Automatic measurement apparatus

• US 3,081,379 A
• Filed: 12/04/1956
• Issued: 03/12/1963
• Est. Priority Date: 12/04/1956
• Status: Expired due to Term

• Current Assignee: Jerome H. Lemelson
• Original Assignee: Jerome H. Lemelson
• Inventors: Lemelson, Jerome H.
• Application Number:
  US03/626,211
• Time in Patent Office: 2,289 Days
• US Class Current: 386/200
• CPC Class Codes: B07C 5/10 measured by light-responsive means sorting according to colour B07C5/342
• CPC Class Codes: G01B 11/022 by means of tv-camera scanning
• CPC Class Codes: G06T 1/0014 Image feed-back for automatic industrial control, e.g. robot with camera robots B25J19/023
• CPC Class Codes: G07D 7/12 Visible light, infrared or ultraviolet radiation
• CPC Class Codes: G08B 13/19602 Image analysis to detect motion of the intruder, e.g. by frame subtraction
• CPC Class Codes: G08B 13/1963 Arrangements allowing camera rotation to change view, e.g. pivoting camera, pan-tilt and zoom [PTZ]
• CPC Class Codes: G08B 13/19634 Electrical details of the system, e.g. component blocks for carrying out specific functions
• CPC Class Codes: G08B 13/19652 Systems using zones in a single scene defined for different treatment, e.g. outer zone gives pre-alarm, inner zone gives alarm
• CPC Class Codes: H04N 5/782 on tape
• CPC Class Codes: Y10T 409/300896 with sensing of numerical information and regulation without mechanical connection between sensing means and regulated means [i.e., numerical control]
• CPC Class Codes: Y10T 409/301176 Reproducing means

Claims

1. AUTOMATIC SCANNING AND CONTROL APPARATUS COMPRISING IN COMBINATION WITH AN ELECTRON BEAM SCANNING APPARATUS INCLUDING MEANS FOR CAUSING AN ELECTRON BEAM TO SCAN AN AREA OF AN IMAGE FIELD IN A SINGLE FRAME SWEEP ALONG A PREDETERMINED PATH IN SAID FIELD AND TO PRODUCE A VIDEO PICTURE SIGNAL OF SAID SCANNING ON AN OUTPUT OF SAID APPARATUS, AN ANALYZING MEANS FOR INSPECTING A PREDETERMINED AREA OF SAID IMAGE FIELD BY THE ANALYSIS OF THAT PORTION OF THE PICTURE SIGNAL GENERATED DURING THE SCANNING BY SAID ELECTRON BEAM OF SAID PREDETERMINED AREA OF SAID IMAGE FIELD, SAID ANALYZING MEANS INCLUDING AN ANALYZING CIRCUIT CONNECTED TO A GATING MEANS IN THE OUTPUT OF A CIRCUIT IN WHICH SAID PICTURE SIGNAL IS GENERATED, A VARIABLE PROGRAMMING MEANS FOR CONTROLLING SAID GATING MEANS WHEREBY TO PREVENT THE PASSAGE OF SAID PICTURE SIGNAL TO SAID ANALYZING CIRCUIT, SAID PROGRAMMING MEANS BEING SYNCHRONIZED IN ITS OPERATION FOR AUTOMATICALLY OPERATING SAID GATING MEANS IN PREDETERMINED TIME RELATION TO THE GENERATION OF SAID PICTURE SIGNAL WHEREBY TO SWITCH IN A MANNER TO PASS TO SAID ANALYZING CIRCUIT ONLY THAT PORTION OF SAID PICTURE SIGNAL WHICH IS GENERATED DURING THE SCANNING OF SAID PREDETERMINED AREA OF SAID IMAGE FIELD.