Electromagnetic wave characteristic display apparatus including multiple probe means
First Claim
17. APPARATUS FOR PROVIDING INFORMATION ON CHARACTERISTICS OF A SYSTEM OPERABLE IN THE ULTRAHIGH AND MICROWAVE FREQUENCY REGION COMPRISING A TRANSMISSION LINE ADAPTED TO BE COUPLED INTO SAID SYSTEM TO RECEIVE CONSTANT AMPLITUDE SIGNALS FROM A SIGNAL GENERATOR, A SET OF FIVE PROBE CIRCUITS SYMMETRICALLY DISPOSED ALONG SAID TRANSMISSION LINE AND SPACED AT ONE-EIGHTH WAVELENGTH INTERVALS AS A FUNCTION OF A TEST FREQUENCY IN SAID ULTRAHIGH AND MICROWAVE FREQUENCY REGION, EACH SAID PROBE CIRCUIT INCLUDING A PROBE ELEMENT, AND MEANS CONNECTED TO SAID PROBE ELEMENT FOR PROVIDING AN OUTPUT SIGNAL AS A FUNCTION OF SIGNALS TRANSMITTED IN SAID TRANSMISSION LINE AS SENSED BY SAID PROBE ELEMENT, FIRST CIRCUIT MEANS TO COMBINE SAID OUTPUT SIGNALS FROM THE TWO OUTSIDE PROBE CIRCUITS AND THE CENTER PROBE CIRCUIT TO PRODUCE A FIRST SIGNAL RELATED TO A FIRST REFERENCE PLANE, AND SECOND CIRCUIT MEANS TO COMBINE SAID OUTPUT SIGNALS FROM THE TWO INTERMEDIATE PROBE CIRCUITS TO PRODUCE A SECOND SIGNAL RELATED TO A SECOND REFERENCE PLANE IN QUADRATURE TO SAID FIRST REFERENCE PLANE.
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17 Claims
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17. APPARATUS FOR PROVIDING INFORMATION ON CHARACTERISTICS OF A SYSTEM OPERABLE IN THE ULTRAHIGH AND MICROWAVE FREQUENCY REGION COMPRISING A TRANSMISSION LINE ADAPTED TO BE COUPLED INTO SAID SYSTEM TO RECEIVE CONSTANT AMPLITUDE SIGNALS FROM A SIGNAL GENERATOR, A SET OF FIVE PROBE CIRCUITS SYMMETRICALLY DISPOSED ALONG SAID TRANSMISSION LINE AND SPACED AT ONE-EIGHTH WAVELENGTH INTERVALS AS A FUNCTION OF A TEST FREQUENCY IN SAID ULTRAHIGH AND MICROWAVE FREQUENCY REGION, EACH SAID PROBE CIRCUIT INCLUDING A PROBE ELEMENT, AND MEANS CONNECTED TO SAID PROBE ELEMENT FOR PROVIDING AN OUTPUT SIGNAL AS A FUNCTION OF SIGNALS TRANSMITTED IN SAID TRANSMISSION LINE AS SENSED BY SAID PROBE ELEMENT, FIRST CIRCUIT MEANS TO COMBINE SAID OUTPUT SIGNALS FROM THE TWO OUTSIDE PROBE CIRCUITS AND THE CENTER PROBE CIRCUIT TO PRODUCE A FIRST SIGNAL RELATED TO A FIRST REFERENCE PLANE, AND SECOND CIRCUIT MEANS TO COMBINE SAID OUTPUT SIGNALS FROM THE TWO INTERMEDIATE PROBE CIRCUITS TO PRODUCE A SECOND SIGNAL RELATED TO A SECOND REFERENCE PLANE IN QUADRATURE TO SAID FIRST REFERENCE PLANE.
Specification
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Current AssigneeEdward H. Shively
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Original AssigneeEdward H. Shively
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InventorsShively, Edward H.
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Application NumberUS04/186,714Time in Patent Office1,420 DaysField of SearchUS Class Current324/646CPC Class CodesG01R 27/32 in circuits having distribu...
