Piezo crystal fluid analyzer
First Claim
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1. IN AN ANALYZER COMPRISING IN COMBINATION, A FIRST DETECTION DEVICE HAVING A PIEZOELECTRIC ELEMENT BEARING A SUBSTRATE WHICH INTERACTS WITH ONE COMPONENT OF A FLUID BEING ANALYZED;
- A SECOND DETECTION DEVICE HAVING A PIEZOELECTRIC ELEMENT WHICH DOES NOT SUBSTANTIALLY INTERACT WITH SAID COMPONENT;
A FIRST OSCILLATING CIRCUIT MEANS FOR OSCILLATING ONE OF SAID DETECTION DEVICES;
A SECOND OSCILLATING CIRCUIT MEANS FOR OSCILLATING THE OTHER OF SAID DETECTION DEVICES;
INDICATING MEANS TO COMPARE THE OSCILLATIONS OF SAID FIRST AND SECOND OSCILLATING CIRCUIT MEANS WHEREBY THE NET OSCILLATIONS ARE DETERMINED;
THE IMPROVEMENT COMPRISING A VARIABLE CIRCUIT ELEMENT OPERATIVELY CONNECTED IN ONE OF SAID OSCILLATING CIRCUIT MEANS TO CHANGE THE FREQUENCY OF OSCILLATION OF SAID OSCILLATING CIRCUIT MEANS IN RESPONSE TO A CHANGE IN THE MAGNITUDE OF SAID VARIABLE CIRCUIT ELEMENT.
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1 Claim
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1. IN AN ANALYZER COMPRISING IN COMBINATION, A FIRST DETECTION DEVICE HAVING A PIEZOELECTRIC ELEMENT BEARING A SUBSTRATE WHICH INTERACTS WITH ONE COMPONENT OF A FLUID BEING ANALYZED;
- A SECOND DETECTION DEVICE HAVING A PIEZOELECTRIC ELEMENT WHICH DOES NOT SUBSTANTIALLY INTERACT WITH SAID COMPONENT;
A FIRST OSCILLATING CIRCUIT MEANS FOR OSCILLATING ONE OF SAID DETECTION DEVICES;
A SECOND OSCILLATING CIRCUIT MEANS FOR OSCILLATING THE OTHER OF SAID DETECTION DEVICES;
INDICATING MEANS TO COMPARE THE OSCILLATIONS OF SAID FIRST AND SECOND OSCILLATING CIRCUIT MEANS WHEREBY THE NET OSCILLATIONS ARE DETERMINED;
THE IMPROVEMENT COMPRISING A VARIABLE CIRCUIT ELEMENT OPERATIVELY CONNECTED IN ONE OF SAID OSCILLATING CIRCUIT MEANS TO CHANGE THE FREQUENCY OF OSCILLATION OF SAID OSCILLATING CIRCUIT MEANS IN RESPONSE TO A CHANGE IN THE MAGNITUDE OF SAID VARIABLE CIRCUIT ELEMENT.
- A SECOND DETECTION DEVICE HAVING A PIEZOELECTRIC ELEMENT WHICH DOES NOT SUBSTANTIALLY INTERACT WITH SAID COMPONENT;
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Current AssigneeWilliam H. King, Jr.
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Original AssigneeWilliam H. King, Jr.
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InventorsKing, William H. Jr.
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Application NumberUS04/233,671Time in Patent Office1,387 DaysField of SearchUS Class Current73/24.06CPC Class CodesG01N 2291/0256 Adsorption, desorption, sur...G01N 29/036 by measuring frequency or r...
