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MEASUREMENT OF SEMICONDUCTOR RESISTIVITY PROFILES BY MEASURING VOLTAGES,CALCULATING APPARENT RESISTIVITIES AND APPLYING CORRECTION FACTORS
US 3,487,301 A
Filed
: 03/04/1968
Issued
: 12/30/1969
Est. Priority Date
: 03/04/1968
Status: Expired due to Term
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Current Assignee
Edward E. Gardner
,
Gorey, Edward F.
,
Schumann, Paul A. Jr.
,
Yeh Tsu-Hsing
Original Assignee
Edward E. Gardner
,
Gorey, Edward F.
,
Schumann, Paul A. Jr.
,
Yeh Tsu-Hsing
Inventors
Gardner, Edward E.
,
Gorey, Edward F.
,
Schumann, Paul A. Jr.
,
YEH TSU-HSING
Application Number
US04/710,297
Time in Patent Office
666 Days
Field of Search
US Class Current
324/717
CPC Class Codes
G01N 27/041
of a solid body
G01R 31/2644
Adaptations of individual s...
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