ANALYSIS OF SPECTRA BY CORRELATION OF INTERFERENCE PATTERNS
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Abstract
A SCANNING INTERFEROMETER OF THE MICHELSON TYPE WHEREIN THE PATH LENGTH DIFFERENCE OF THE TWO INTERFERING BEAMS IN THE INTERFEROMETER IS CONTINUOUSLY VARIED IN A PREDETERMINED MANNER, AND A ROTATABLE MIRROR IS PROVIDED FOR SCANNING OR DISPERSING THE EMERGENT, INTENSITY MODULATED LIGHT SYNCHRONOUSLY WITH THE VARYING PATH LENGTH DIFFERENCE ACROSS A MASK CONTAINING A SERIES OF LINES CORRESPONDING TO A PATTERN PRODUCED BY INTENSITY MODULATED LIGHT OF KNOWN SPECTRAL CONTENT.
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