TESTING OF SEMI-CONDUCTOR DEVICES

• US 3,704,418 A
• Filed: 08/11/1970
• Issued: 11/28/1972
• Est. Priority Date: 08/11/1969
• Status: Expired due to Term

• Current Assignee: George Coffin
• Original Assignee: George Coffin
• Inventors: Coffin, George
• Primary Examiner(s): Rolinec, Rudolph V.
• Assistant Examiner(s): Karlsen, Ernest F.
• Application Number:
  US05/062,970
• Time in Patent Office: 840 Days
• Field of Search: 324/158F,158P,73R
• US Class Current: 324/750.19
• CPC Class Codes: B07C 5/344 according to electric or electromagnetic properties sorting according to size measured electrically or electronically B07C5/08; material testing by magnetic means G01N24/00, G01N27/00, by electrical means G01N27/00; electrical measuring devices in general G01R; coin testing G07D5/00
• CPC Class Codes: G01R 31/2632 for testing diodes

Abstract

A method of testing a plurality of semi-conductor devices simultaneously in which the devices are placed in a testing station, at which point each device is tested and the information is stored in a memory unit, the devices then being moved to a control station, and while a second set of devices are being tested at the testing station, the memory unit operating so that an observer sees at the control station a spot of light for each faulty device, so that the faulty devices can be readily marked.

Claims

1. Apparatus for testing a plurality of semi-conductor devices simultaneously, comprising a rotatable support incorporating a loading station for receiving successively first, second and third sets of devices, each set constituting a plurality of devices disposed in a given position, a testing station angularly spaced from the loading station on said support and including a test head Having a plurality of probes, one probe for each device in a given set, for simultaneously testing respective devices in said given set, a memory unit associated with the test head for storing information derived therefrom, a control station separate and angularly spaced from the testing station on said support so that in use while a first set of devices are situated at the control station, a second set of devices can be tested at the testing station, and a third set of devices can be loaded on said support at said loading station, and an optical display unit disposed at the control station and operable by the memory unit for generating a spot of light on each faulty device in said given set, whereby any faulty devices are indicated.