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POLARIZATION INTERFEROMETER

  • US 3,728,030 A
  • Filed: 06/22/1970
  • Issued: 04/17/1973
  • Est. Priority Date: 06/22/1970
  • Status: Expired due to Term
First Claim
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1. In dichroism measurement apparatus, the combination comprising, a. a source of electromagnetic radiation of different wavelengths lambda , b. interferometer means for processing source radiation and wherein the phase between orthogonally polarized beams is varied to provide a resultant beam characterized, for each wavelength, by ellipticity that alternates between left and right circular polarization and between which the beam polarization becomes linear in one direction as the ellipticity alternates from left to right circular polarization, and linear in another direction as the ellipticity alternates from right to left circular polarization, the characteristic frequency Nu a of such alternation varying as a function of the wavelength, c. a sample space located for effecting passage of the elliptically polarized beam through a dichroic sample in that space, the sample differentially absorbing the alternately polarized radiation of a characteristic set of wavelengths lambda , and d. a beam intensity detector located in the path of the beam passing from the sample space and characterized as having signal output that varies in intensity with frequency Nu a when said sample is in said space, said output adapted for processing to produce dichroic spectra varying with wavelength lambda .

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