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ELECTRICAL TESTING INSTRUMENT STRUCTURE

  • US 3,757,218 A
  • Filed: 12/13/1971
  • Issued: 09/04/1973
  • Est. Priority Date: 12/13/1971
  • Status: Expired due to Term
First Claim
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1. An instrument for use in determining electrical characteristics of test circuitry, said instrument comprising a housing having top and bottom walls interconnected by a plurality of sidewalls, circuit means disposed within said housing for providing output signals which vary as function variations in the electrical characteristics of the test circuitry, a probe movable between a storage position adjacent to said housing and a test position in which said probe is spaced from said housing and is engageable with the test circuitry, cable means for conducting input signals from said probe to said circuit means, and recess means within said housing adjacent to said bottom wall for receiving a plurality of turns of said cable means to retain said cable means in a coiled condition within said housing when said probe is in the storage position, said recess means including a continuous opening extending around said housing adjacent to said bottom wall and exposed to the exterior of said housing to enable said cable means to be coiled around said housing within said recess means.

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