APPARATUS FOR TESTING A CREDIT CARD

• US 3,795,805 A
• Filed: 05/18/1973
• Issued: 03/05/1974
• Est. Priority Date: 05/18/1973
• Status: Expired due to Term

• Current Assignee: James M. Wilson, Melvin E. Swanberg
• Original Assignee: James M. Wilson, Melvin E. Swanberg
• Inventors: Wilson, James M., Swanberg, Melvin E.
• Primary Examiner(s): Lawrence, James W.
• Assistant Examiner(s): Grigsby, T. N.
• Application Number:
  US05/361,742
• Time in Patent Office: 291 Days
• Field of Search: 356/71 250/219DQ,209,226,219D 194/4R 340/149A 235/61.8R,61.8A
• US Class Current: 250/226
• CPC Class Codes: G06Q 20/3433 the counter having monetary units
• CPC Class Codes: G07F 7/02 by keys or other credit registering devices
• CPC Class Codes: G07F 7/086 by passive credit-cards adapted therefor, e.g. constructive particularities to avoid counterfeiting, e.g. by inclusion of a physical or chemical security-layer for security documents G07D7/00; for the reading of record-carriers in general G06K7/00; for the design of coded credit-cards G06K19/10

Abstract

Apparatus for testing a credit card having a coating of a substance which when treated sufficiently permanently and irreversably changes from a first state having one characteristic of reflectivity for visible light components incident thereon to a second state having a second characteristic of reflectivity for the light components. Preferably, in the first state the substance is highly light reflective and reflects light of different wavelengths unequally, and in the second state the substance is light transparent. Treating of the substance is accomplished by heating the substance, preferably with a high intensity light beam. Authenticity of the credit card is achieved by first measuring the amplitude of visible light components (colors) reflected by the substance when the substance is treated initially, and by a later spectral reflectance test after additional treating which, by sensing the change in amplitude of a previously highly reflected visible light component, indicates that the substance has changed to the second state in response to the additional treating. The authentification apparatus includes a light source for treating a selected area of the coating and a plurality of photoresponsive elements each responsive to light of a selected wave length and connected in electrical integration networks. The integration networks transforms the amplitude representative signals supplied thereto to time amplitude varying signals which are supplied to flip-flop circuits of a logic circuit which also includes at least one nor gate and a latch circuit. If the credit card is authentic, the amplitudes of the output signals of the integration networks increase and decrease in the proper sequence to control the logic circuit such that it produces an acceptance or '"'"''"'"''"'"''"'"'authentic'"'"''"'"''"'"''"'"' signal. The latch circuit holds the '"'"''"'"''"'"''"'"'authentic'"'"''"'"''"'"''"'"' signal until circuitry responsive to the '"'"''"'"''"'"''"'"'authentic'"'"''"'"''"'"''"'"' signal performs a desired function, after which the credit card is indexed to a new position such that a different selected area of the coating of the credit card is processed to determine its authenticity.

Claims

1. Apparatus for testing the authenticity of a credit card having a layer of a substance with a first optical reflectance characteristic when within a first temperature range, and a second optical reflectance characteristic when heated to a temperature beyond said first temperature range, comprising:

first means for heating said substance through at least a portion of said first temperature ranGe and thereafter to beyond said first temperature range, second means for projecting a high intensity beam of light onto said substance, a plurality of photoelectric assemblies positioned adjacent said substance, each of said photoelectric assemblies responsive to electromagnetic radiation of a different frequency reflected by said substance, a plurality of networks, each including a component of said photoelectric assemblies, for transforming the electromagnetic radiation of said different frequencies to time-amplitude varying electrical signals, and logic means coupled to said networks for determining if said time-amplitude varying electrical signals are within desired amplitude ranges when said substance is heated through said first temperature range and beyond said first temperature range.

2. The apparatus of claim 1 wherein said first and second means is a single high intensity light source.

3. The apparatus of claim 1 wherein said networks are electrical integration networks.

4. The apparatus of claim 3 wherein each of said photoelectric assemblies includes a light filter responsive only to light of a given frequency and a photoconductor positioned to receive only light passing through said filter associated therewith, said photoconductors being components of said electrical integration networks.

5. The apparatus of claim 4 wherein said logic means includes an electrical latch circuit.

6. The apparatus of claim 5 wherein said logic means further includes first and second flip-flop circuits and a multi-input electronic gate, the high voltage output of said first flip-flop is coupled to an input of said second flip-flop, and the low voltage output of said second flip-flop is supplied to an input of said gate, said plurality of photoelectric assemblies being three in number with the output of two of said assemblies being supplied to the arming and clock terminals of said first flip-flop, and the output of said other photoelectric assembly being supplied to the clock input of said second flip-flop.

7. The apparatus of claim 6 wherein said apparatus includes means for preventing stray light from affecting said photoelectric assemblies.

8. Apparatus for testing the authenticity of areas of a layer of a substance having a first optical reflectance characteristic when within a first temperature range and a second optical reflectance characteristic when heated to a temperature beyond said first temperature range, said substance forming part of a credit card, comprising:

means for heating one area of said substance through at least a portion of said first temperature range and thereafter beyond said first temperature range, means for projecting a high intensity beam of light onto said one area of said substance, a plurality of photoelectric assemblies positioned adjacent said substance, each of said photoelectric assemblies being responsive to electromagnetic radiation of a different frequency reflected by said area, a plurality of networks, each including a component of said photoelectric assemblies for transforming the electromagnetic radiation of said different frequencies to time-amplitude varying electrical signals, logic means coupled to said networks for determining if said electromagnetic radiation of different frequencies reflected by said area is within desired amplitude ranges during both said first temperature range and beyond said first temperature range, and means for moving said credit card after said area of said substance has been tested so that another area of said credit card can be tested.

9. The apparatus of claim 8 wherein each of said photoelectric assemblies includes a filter responsive only to light of a given frequency and a photoconductor positioned to receive only light passing through said filter associated therewith.

10. The apparatus of claim 9 wherein said logic means includes first and second flip-flop circuits and a multi-input electronic gate, the high voltage Output of said first flip-flop is coupled to an input of said second flip-flop, and the low voltage output of said second flip-flop is supplied to an input of said gate, said plurality of photoconductor assemblies being three in number with the output of two of said assemblies being supplied to the arming and clock terminals of said first flip-flop, and the output of said other photoconductor assembly being supplied to the clock input of said second flip-flop.