APPARATUS FOR SURFACE WAVE PARAMETER DETERMINATION

• US 3,864,667 A
• Filed: 09/11/1970
• Issued: 02/04/1975
• Est. Priority Date: 09/11/1970
• Status: Expired due to Term

• Current Assignee: Dhari S. Bahjat
• Original Assignee: Dhari S. Bahjat
• Inventors: Bahjat, Dhari S.
• Primary Examiner(s): Wilbur, Maynard R.
• Assistant Examiner(s): Birmiel, H. A.
• Application Number:
  US05/071,488
• Time in Patent Office: 1,607 Days
• Field of Search: 340/15.5SS,15.5DP,15.5SW,15.5MC,15.5R
• US Class Current: 367/48
• CPC Class Codes: G01V 1/003 Seismic data acquisition in general, e.g. survey design G01V1/3808, G01V1/42 take precedence

Abstract

An improved method and apparatus for determining the parameters of a near surface layer and particularly the parameters of the weathering layer utilizing the variation of phase velocity with respect to frequency of surface waves generated by a continuously varying frequency signal and subsequently utilizing the determined parameters of the weathering layer to calculate a time correction factor to correct the reflection traces of a seismogram.

Claims

1. Apparatus for determining the observed frequency and the observed phase shift of a surface wave at a particular test location, the observed frequency and the observed phase shift being utilized to determine the parameters of a near surface layer of the earth, comprising:

means for generating a continuously varying frequency seismic signal through the earth;

a pair of detectors disposed at the test location adapted to detect the surface wave component of the seismic signal, the detectors being spaced a predetermined distance apart;

means for measuring the observed frequency of the surface wave detected by the two detectors; and

means for measuring the observed phase shift of the surface wave detected by the two detectors.

2. The apparatus of claim 1 wherein the means for measuring the observed frequency is further defined as being a frequency counter connected to each detector at the particular test location.

3. The apparatus of claim 1 wherein the means for measuring the observed phase shift is further defined as being an oscilloscope connected to each detector at the particular test location.