TUNING AND MATCHING OF FILM INDUCTORS OR TRANSFORMERS WITH PARAMAGNETIC AND DIAMAGNETIC SUSPENSIONS

• US 3,864,824 A
• Filed: 10/26/1973
• Issued: 02/11/1975
• Est. Priority Date: 12/27/1971
• Status: Expired due to Term

• Current Assignee: James C. Watson, Roy J. Hebert
• Original Assignee: James C. Watson, Roy J. Hebert
• Inventors: Watson, James C., Hebert, Roy J.
• Primary Examiner(s): Lanham, C. W.
• Assistant Examiner(s): Hall, Carl E.
• Application Number:
  US05/410,143
• Time in Patent Office: 473 Days
• Field of Search: 29/602,607,608,609,593 336/233,234 117/234,235,240
• US Class Current: 29/608
• CPC Class Codes: H01F 21/02 continuously variable, e.g. variometers
• CPC Class Codes: H01F 41/0246 Manufacturing of magnetic circuits by moulding or by pressing powder magnetic cores made by moulding or by pressing powder H01F27/255; soft magnetic particles H01F1/20, H01F1/36
• CPC Class Codes: H05K 1/165 incorporating printed inductors
• CPC Class Codes: H05K 2201/086 for inductive purposes, e.g. printed inductor with ferrite core
• CPC Class Codes: H05K 2201/09263 Meander
• CPC Class Codes: H05K 2203/0126 Dispenser, e.g. for solder paste, for supplying conductive paste for screen printing or for filling holes
• CPC Class Codes: H05K 2203/0545 Pattern for applying drops or paste; Applying a pattern made of drops or paste using thick film techniques to apply conductive material by using a substrate with a shape pattern H05K3/1258
• CPC Class Codes: H05K 2203/171 Tuning, e.g. by trimming of printed components or high frequency circuits
• CPC Class Codes: Y10T 29/49004 including measuring or testing of device or component part
• CPC Class Codes: Y10T 29/49076 From comminuted material

Abstract

Thin or thick film inductors or transformers are tuned and/or matched by the application of a blend of a paramagnetic or diamagnetic material or both mixed with a binder such as epoxy which binder matches the fabrication materials and processes of the inductors or transformers.

Claims

1. A method of altering the inductance of an inductive device comprising the steps of:

measuring the inductance of said device;

selecting a suspension of either a paramagnetic material or a diamagnetic material, the material selected depending on the relationship of the measured inductance value of said device to a preselected inductance value;

incrementally applying to said device the selected materials;

allowing said selected material to harden; and

again measuring the inductance of said device and applying a suspension of the other one of the paramagnetic and diamagnetic materials until said preselected inductance value is reached, said selecting step consisting of selecting the diamagnetic material when the measured inductance value of said device is greater than the preselected inductance value.

2. A method of altering the inductance of an inductive device comprising the steps of:

measuring the inductance of said device;

selecting a suspension of either a paramagnetic material or a diamagnetic material, the material selected depending on the relationship of the measured inductance value of said device to a preselected inductance value;

selecting said material from a diamagnetic group of materials consisting of copper, gold, zinc and bismuth when the measured inductance value exceeds the preselected inductance value;

incrementally applying to said device the selected materials;

allowing said selected material to harden; and

again measuring the inductance of said device and applying a suspension of the other one of the paramagnetic and diamagnetic materials until said preselected inductance value is reached.

3. A method for decreasing the inductance of an inductive device comprising the steps of:

measuring the inductance of said device;

incrementally applying a hardenable diamagnetic material to said device;

allowing said material to harden; and

sequentially measuring the inductance of said device and applying increments of said diamagnetic material as a function of the measured inductance value of said device relative to a preselected inductance value until said preselected inductance value is measured.

4. The method of claim 3 further including after the measuring step, the step of:

selecting the diamgnetic material from the group consisting of copper, gold, zinc and bismuth.