X-RAY DIFFRACTION INSTRUMENT

• US 3,868,506 A
• Filed: 07/30/1973
• Issued: 02/25/1975
• Est. Priority Date: 02/20/1973
• Status: Expired due to Term

• Current Assignee: Katsuhiko Ogiso
• Original Assignee: Katsuhiko Ogiso
• Inventors: Ogiso, Katsuhiko
• Primary Examiner(s): Lawrence, James W.
• Assistant Examiner(s): Anderson, B. C.
• Application Number:
  US05/383,611
• Time in Patent Office: 575 Days
• Field of Search: 250/272,277,278,279,490,491
• US Class Current: 378/72
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

According to this invention a mount for X-ray tubes is rotatable around the axis of an X-ray which is incident upon a specimen. A support for the mount is rotatable around a straight line passing through the point at which the X-ray is incident upon the specimen and a holder for a first guide rail is rotatable around a straight line which intersects a first straight line at right angles. Guide rails permit the X-ray sources and diffracted X-ray detectors to travel along such guide rails, so that the internal strain, residual austenite and crystal orientation of the specimen can be measured without being limited by the configuration of specimen'"'"''"'"'s surface.

Claims

1. An x-ray diffraction instrument comprising a mount for an xray source;

an x-ray source constructed and arranged on said mount;

a first circular guide rail constructed and arranged on said mount;

said first circular guide rail having its center aligned with a point where an x-ray from said source is incident on a specimen;

a plurality of detectors for detecting diffracted x-ray arranged on said first circular guide rail;

a second circular guide rail having its center aligned with said x-ray incident point;

a support for supporting said mount to rotate said mount around an axis aligned with the direction of x-ray incident onto the specimen, said support being movable along said second circular guide rail;

means for holding said circular guide rail to rotate said second rail around an axis formed by a vertical straight line passing through said x-ray incident point; and

a shaft for carrying said means to rotate said holder around an axis formed by a horizontal straight line intersecting said vertical straight line at said x-ray incident point.

2. An X-ray diffraction instrument according to claim 1, characterized in that the rotation centers of the mount, first guide rail, the support and the centers of the first and second circular guide rails are all at the point where the X-ray is incident onto the specimen.

3. An x-ray diffraction instrument according to claim 1, characterized in that the three detectors for the diffracted x-ray are arranged on the first guide rail;

and an electric motor and a gear box are constructed and arranged with said mount for driving the first and second detectors in symmetrical relation with the direction of the incident x-ray and for driving the second and third detectors in the same direction at the same angular speed.