Process and apparatus for sensing magnitude and direction of lateral displacement

• US 3,930,734 A
• Filed: 04/26/1974
• Issued: 01/06/1976
• Est. Priority Date: 04/26/1974
• Status: Expired due to Term

• Current Assignee: Atlantic Research Corporation (L3Harris Technologies, Inc.)
• Original Assignee: Atlantic Research Corporation (L3Harris Technologies, Inc.)
• Inventors: Holly, Sandor, Chao, Shui Lin
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): Clark, Conrad J.
• Application Number:
  US05/464,597
• Time in Patent Office: 620 Days
• Field of Search: 356/28, 356/106 R, 356/27, 356/111, 356/169
• US Class Current: 356/488
• CPC Class Codes: G01D 5/38 by diffraction gratings

Abstract

Process and apparatus therefor for sensing the magnitude and direction of lateral displacement of at least one line or slit element of an article which comprises producing two coherent light beams of the same intensity, one of the beams having a different frequency from that of the other beam, the frequency difference Δf being within the radio frequency range; converging the two beams to form an interference zone comprising, within the zone of convergence, a fringe pattern characterized by continuous lateral movement at a rate equal to Δf; adjusting the fringe period of the pattern to a width which is substantially wider than the element or the positive difference between the width of the element and an integer multiple of the fringe period; positioning at least the portion of the article bearing the element within the interference zone in such manner that the article lies in a plane defined by the x and y axes of the fringe pattern and the element is in a position, relative to the article, such that its longitudinal axis is substantially parallel to a fringe plane; laterally shifting the fringe zone and/or the article along the y-axis to produce relative lateral displacement between them while maintaining the element in substantially parallel fringe-plane alignment at least within the central portion of the fringe zone; continuously determining the phase of the RF signal component of the radiation scattered or transmitted by the element as the relative lateral displacement between the zone and article continues from a first to a second position of the element within the fringe zone; simultaneously and continuously comparing the phase of the scattered or transmitted radiation RF signal with the phase of a constant reference RF of Δf frequency; and sensing the magnitude and direction of phase shift between the RF signal component of the scattered or transmitted radiation and the RF reference between the first and second positions, whereby the magnitude indicates the extent of lateral displacement of the element between the two positions and the direction indicates the direction of relative lateral displacement. The element can comprise a single element, two essentially parallel elements, or a plurality of elements wherein at least each two adjacent elements are substantially parallel. The process and apparatus are particularly useful for accurate measurement of fractional distances between two elements with a high degree of fine resolution; the total magnitude and direction of displacement of elements of a measuring device, such as an encoder; and the distance from a reference element to a desired position on the article.

Claims

1. A process for sensing the magnitude and direction of lateral displacement of at least one line or slit element of an article comprising:

1. producing two coherent light beams of the same intensity, one of said beams having a different frequency from said other beam, the frequency difference Δ

f being within the radio frequency range;

2. converging said beams to form an interference zone comprising a fringe pattern within the zone of convergence, said fringe pattern continuously moving laterally at a rate equal to Δ

f;

3. adjusting the fringe period λ

_s of the pattern to a width which is substantially wider than the width w of said element or the positive difference between the width of the element and an integer multiple of the fringe period nλ

_s ;

4. positioning at least the portion of said article bearing said element within the interference zone in such manner that said article lies in a plane defined by the x-axis normal to the plane of the convergent beams and the y-axis normal to the fringe planes, and said element is in a position, relative to said article, such that the longitudinal axis of said element is substantially parallel to a fringe plane;

5. laterally shifting the fringe zone and/or the article positioned within said fringe zone along the y-axis in such a manner as to produce relative lateral displacement between them while maintaining said element substantially parallel to the fringe plane at least at the central portion of the fringe zone;

3. The process of claim 1 wherein said element is a single element and said second position is a desired spatial position on said article.

4. The process of claim 1 wherein said at least one element comprises two substantially parallel elements;

the fringe period λ

_s or its integer multiple nλ

_s is additionally adjusted to be substantially equal to the distance d between the elements; and

the diameter D of the fringe zone is adjusted to be wider than d.

5. The process of claim 3 wherein said two elements respectively represent said first and second positions.

6. The process of claim 1 wherein said at least one element comprises a plurality of substantially equidistant elements;

each of said plurality of elements is substantially parallel to the next adjacent element;

the fringe period λ

_s or its integer multiple nλ

_s is additionally adjusted to be substantially equal to the distance d between the elements; and

the diameter D of the fringe zone is adjusted to be wider than d.

7. The process of claim 5 wherein the distance between said first and second positions includes an integer multiple of d.

8. The process of claim 5 wherein said elements comprise a linear array of substantially parallel elements.

9. The process of claim 6 wherein said elements comprise a linear array of substantially parallel elements.

10. The process of claim 5 wherein said elements comprise a circular array of elements positioned adjacent the outer periphery of a circular article.

11. The process of claim 6 wherein said elements comprise a circular array of elements positioned adjacent the outer periphery of a circular article.

12. The process of claim 9 wherein the article is a disc encoder.

13. The process of claim 10 wherein the article is a disc encoder.

14. The process of claim 9 wherein the two beams of different frequency are each equally divided to form at least two sets of two beams having the same frequency characteristics as the parent beams;

said at least two sets of beams are oriented to converge and form at least two moving fringe patterns at predetermined spatially-separated positions with respect to said circular array of elements.

15. The process of claim 10 wherein the two beams of different frequency are each equally divided to form at least two sets of two beams having the same frequency characteristics as the parent beams;

said at least two sets of beams are oriented to converge and form at least two moving fringe patterns at predetermined spatially-separated positions with respect to said circular array of elements.

16. The process of claim 11 wherein the two beams of different frequency are each equally divided to form at least two sets of two beams having the same frequency characteristics as the parent beams;

said at least two sets of beams are oriented to converge and form at least two moving fringe patterns at predetermined spatially-separated positions with respect to said circular array of elements.

17. The process of claim 12 wherein the two beams of different frequency are each equally divided to form at least two sets of two beams having the same frequency characteristics as the parent beams;

said at least two sets of beams are oriented to converge and form at least two moving fringe patterns at predetermined spatially-separated positions with respect to said circular array of elements.

18. The process of claim 1 wherein the fringe period is at least twice as wide as the element.

20. The process of claim 3 wherein the fringe period is at least twice as wide as the element.

21. The process of claim 4 wherein the fringe period is at least twice as wide as the element.

22. The process of claim 5 wherein the fringe period is at least twice as wide as the element.

23. The process of claim 6 wherein the fringe period is at least twice as wide as the element.

24. The process of claim 7 wherein the fringe period is at least twice as wide as the element.

25. The process of claim 8 wherein the fringe period is at least twice as wide as the element.

26. The process of claim 9 wherein the fringe period is at least twice as wide as the element.

27. The process of claim 10 wherein the fringe period is at least twice as wide as the element.

28. The process of claim 11 wherein the fringe period is at least twice as wide as the element.

29. The process of claim 12 wherein the fringe period is at least twice as wide as the element.

30. The process of claim 13 wherein the fringe period is at least twice as wide as the element.

31. The process of claim 14 wherein the fringe period is at least twice as wide as the element.

32. The process of claim 15 wherein the fringe period is at least twice as wide as the element.

33. The process of claim 16 wherein the fringe period is at least twice as wide as the element.

34. The process of claim 3 wherein d equals λ

_s.

35. The process of claim 4 wherein d equals λ

_s.

36. The process of claim 5 wherein d equals λ

_s.

37. The process of claim 6 wherein d equals λ

_s.

38. The process of claim 7 wherein d equals λ

_s.

39. The process of claim 8 wherein d equals λ

_s.

40. The process of claim 9 wherein d equals λ

_s.

41. The process of claim 10 wherein d equals λ

_s.

42. The process of claim 11 wherein d equals λ

_s.

43. The process of claim 12 wherein d equals λ

_s.

44. The process of claim 13 wherein d equals λ

_s.

45. The process of claim 14 wherein d equals λ

_s.

46. The process of claim 15 wherein d equals λ

_s.

47. The process of claim 16 wherein d equals λ

_s.

49. The process of claim 20 wherein d equals λ

_s.

50. The process of claim 21 wherein d equals λ

_s.

51. The process of claim 22 wherein d equals λ

_s.

52. The process of claim 23 wherein d equals λ

_s.

53. The process of claim 24 wherein d equals λ

_s.

54. The process of claim 25 wherein d equals λ

_s.

55. The process of claim 26 wherein d equals λ

_s.

56. The process of claim 27 wherein d equals λ

_s.

57. The process of claim 28 wherein d equals λ

_s.

58. The process of claim 29 wherein d equals λ

_s.

59. The process of claim 30 wherein d equals λ

_s.

60. The process of claim 31 wherein d equals λ

_s.

61. The process of claim 32 wherein d equals λ

_s.

63. The apparatus of claim 61 wherein the shifting means comprises means for shifting the article.

64. The apparatus of claim 61 wherein the means for producing the RF reference is the means for producing the two light beams of different frequency, the frequency difference Δ

f being in the radio frequency range.

66. The apparatus of claim 61 which includes means for computing the extent of phase shift between the radiation RF phase and the RF reference phase.

68. The apparatus of claim 63 which includes means for computing the extent of phase shift between the radiation RF phase and the RF reference phase.

69. The apparatus of claim 64 which includes means for computing the extent of phase shift between the radiation RF phase and the RF reference phase.

2. continuously determining the phase of the RF signal component of the radiation scattered or transmitted by said element as said relative lateral displacement between said zone and article continues from a first position to a second position of said element within the fringe zone;

7. simultaneously continuously comparing the phase of the scattered or transmitted radiation RF signal with the phase of a constant RF reference having a frequency equal to Δ

f; and

8. sensing the magnitude and direction of phase shift between said radiation RF signal and said RF reference between first and second positions, whereby said magnitude indicates the extent of lateral displacement of the element between said first and second position and said direction indicates the direction of relative lateral displacement.

19. The process of claim 2 wherein the fringe period is at least twice as wide as the element.

48. The process of claim 19 wherein d equals λ

_s.

62. Apparatus for sensing the magnitude and direction of displacement of at least one line or slit element on an article, comprising:

1. means for producing two convergent coherent light beams of the same intensity, one of said beams having a different frequency from said other beam, the frequency difference Δ

f being within the radio frequency range;

2. means for positioning at least the portion of said article bearing said element within the interference fringe zone produced by the convergence of said two beams, said interference fringe zone comprising a laterally moving fringe pattern having a predetermined fringe period, said article being positioned in such manner that it lies in a plane defined by the axis normal to the plane of the convergent beams and the axis normal to the fringe planes, and said element is in a position, relative to said article such that the longitudinal axis of said element is substantially parallel to the fringe plane;

3. adjustment means capable of setting said predetermined fringe period at a size substantially wider than said element or the positive difference between the width of the element and a whole integer multiple of the fringe period;

4. means for shifting said fringe zone and/or said article positioned within said fringe zone relative to each other along the y-axis;

5. means for separating the RF signal component from the radiation scattered by said line element or transmitted by said slit element;

6. means for producing a constant RF reference having a frequency Δ

f;

7. means for continuously detecting and comparing the phase of the radiation RF signal and the phase of the RF reference.

65. The apparatus of claim 62 wherein the means for producing the RF reference is the means for producing the two light beams of different frequency, the frequency difference Δ

f being in the radio frequency range.

67. The apparatus of claim 62 which includes means for computing the extent of phase shift between the radiation RF phase and the RF reference phase.

70. The apparatus of claim 65 which includes means for transmitting the phase shift information to a data acquisition system capable of producing a display or recording.

71. The apparatus of claim 65 which includes means for transmitting the phase shift information to controls in a manufacturing process.