Programmable tester

• US 3,931,506 A
• Filed: 12/30/1974
• Issued: 01/06/1976
• Est. Priority Date: 12/30/1974
• Status: Expired due to Term

• Current Assignee: Zehntel, Inc. (Teradyne Incorporated)
• Original Assignee: Zehntel, Inc. (Teradyne Incorporated)
• Inventors: Borrelli, Ronald N., Raymond, Douglas W.
• Primary Examiner(s): Atkinson, Charles E.
• Application Number:
  US05/537,563
• Time in Patent Office: 372 Days
• Field of Search: 235/153 AC, 340/172.5, 324/73 R
• US Class Current: 714/724
• CPC Class Codes: G01R 31/2832 Specific tests of electronic circuits not provided for elsewhere G01R31/2801, G01R31/316 take precedence
• CPC Class Codes: G01R 31/31915 In-circuit Testers

Abstract

A method and apparatus for automatic, programmed, in-circuit component testing and functional testing. A multi-mode measurement unit having an exciter circuit, computing circuit, and a converter circuit is provided for measuring electrical signals. The measurement unit is controlled by a program-commanded measurement unit controller. A plurality of device connection switches are provided for connecting, by a program-commanded switch controller, the computing circuit to selected nodes of a circuit under test. The switch controller and the measurement unit controller receive commands from a programmed processor which executes stored programs of instruction. The programs contain subroutines which correlate with commanded measurement parameters and sequences within the measurement unit.

Claims

1. A testing apparatus for testing electrical properties of a circuit under test formed by a plurality of components interconnected at nodes comprising,

a plurality of selectable connection switches having switch outputs for connection to selected nodes of the circuit under test,

connection switch controller means for controlling said connection switches to connect said switch outputs to said selected nodes,

controllable measurement unit means connected to receive said switch outputs for measuring electrical properties of the circuit under test with predetermined tests,

measurement unit controller means for controlling said measurement unit means to perform predetermined tests,

program controlled processor means for processing a program of instructions, including subroutines of instructions correlated to predetermined tests in said measurement unit, said processor connected to said connection switch controller to cause said switch outputs to be connected to said selected nodes and said processor connected to said measuring unit controller for controlling said measurement unit to perform a selected one of the predetermined tests in accordance with a correlated subroutine.

2. The apparatus of claim 1 wherein said circuit under test includes N nodes, wherein each of said connection switches includes N lines connected to said N codes, and wherein at least two of said connection switches each includes means for selecting one of said N lines as one of said switch outputs.

3. The apparatus of claim 1 wherein said circuit under test includes N nodes, wherein each of said connection switches includes N lines connected to said N nodes, wherein at least one of said connection switches includes means for selecting one of said N lines as one of said switch outputs and wherein at least one of said selection switches includes means for connecting (N-1) of said N lines in common as one of said switch outputs.

4. The apparatus of claim 1 wherein said circuit under test includes N nodes, wherein each of said connection switches includes N lines connected to said N nodes, wherein at least one of said connection switches includes means for selecting one of said N lines as one of said switch outputs, and wherein at least one of said connection switches includes means for selecting (N-P-1) of said N lines in common as one of said switch outputs where P is an integer less than N.

5. The apparatus of claim 1 wherein said circuit under test includes N nodes, wherein each of said connection switches includes N lines connected to said N nodes, and wherein said connection switches include,

a first switch for selecting one of said N lines as one of said switch outputs,

a second switch for selecting one of said N lines as one of said switch outputs,

a third switch for selecting M of said N lines in common as one of said switch outputs, where M is any integer less than N.

6. The apparatus of claim 1 including a functional tester connected to said processor means for performing functional tests on said circuit under test, said functional tester comprising,

a plurality of program selectable signal sources for providing excitation signals under program control,

first switch means for connecting a selected one of said signal sources to one or more nodes of said circuit under test,

a plurality of selectable measuring devices selectable under program control for measuring signals in said circuit under test in response to an excitation signal provided by the selected one of said signal sources,

second program selectable switch means for connecting output nodes from said circuit under test to said selected one of said measurement devices.

7. The apparatus of claim 6 including transfer circuit means for transferring, under program control said switch output from said measuring unit means to said functional tester.

8. The apparatus of claim 1 wherein said measurement unit means includes exciter circuit means having a plurality of excitation sources for providing excitation signals for exciting said circuit under test and includes means for selecting one of said sources under program control.

9. The apparatus of claim 8 wherein said sources include an AC source for providing an AC excitation signal and a DC source for providing a DC excitation signal and wherein said exciter circuit means includes a digital multiplier for multiplying a selected one of said excitation signals by a program commanded digital value.

10. The apparatus of claim 1 wherein said measuring unit means includes a signal source for providing an excitation signal and a multiplying digital-to-analog converter connected to multiply said excitation signal by a quantity specified by a digital input and wherein said measurement unit controller means includes means for providing said digital input under program control.

11. The apparatus of claim 10 including inhibit means for selectively inhibiting said excitation signal from said digital-to-analog converter until a zero crossing of said excitation signal occurs and zero detection means for detecting zero crossing of said excitation signal.

12. The apparatus of claim 1 wherein said measurement unit means includes an excitation means for providing excitation signals under program control, includes computing circuit means connected under program control to said circuit under test by said device connection switches and responsive to said excitation signal to provide a measurement signal, and includes converter means for converting said measurement signal to a digital representation under program control.

13. The apparatus of claim 12 wherein said computing circuit means includes at least one computing resistor, a computing amplifier and a plurality of selectable configuration switches for connecting under program control and computing resistor, said computing amplifier and said switch outputs of said connection switches in a plurality of connection modes.

14. The apparatus of claim 13 including a plurality of computing resistors and a plurality of associated resistor switches selectable one at a time under program control for selecting the magnitude of the computation to be performed by said computing circuit.

15. The apparatus of claim 13 wherein said device connection switches include a first switch, a second switch and a third switch, and wherein said computing circuit means includes,

means for connecting said circuit under test in a first mode including means to connect the switch output from said first switch in series with said computing resistor to connect said excitation means to said circuit under test and including means to connect the switch outputs from said second and third switches to said converter,

means for connecting said circuit under test in a second mode including means for connecting said computing resistor between said excitation means and said computing amplifier, including means for connecting the switch output from said first and second switches to the input and output of said computing amplifier, respectively, whereby a component in said circuit under test is connected under program control across the input and output of said computing amplifier, and including means for connecting the switch output from said third switch to ground whereby components in said circuit under test are isolated,

means for connecting said circuit under test in a third mode including means for connecting the switch output from said first switch to said excitation means whereby said first switch under program control connects a first node of a component in said circuit under test to said excitation means, including means for connecting the switch output from said second switch as an input to said computing amplifier whereby said second switch under program control connects a second node of said component under test as an input to said computing amplifier, including means for connecting said computing resistor between the input and output of said computing amplifier, including means for connecting the switch output from said third switch to ground whereby components in said circuit under test are isolated, and including means for connecting said computing amplifier to said converter.

16. The apparatus of claim 12 wherein said excitation means is referenced to a first ground and said converter means is referenced to a second ground so that the excitation means is floated with respect to said measurement unit means and wherein said measurement unit means includes means, under program control, for connecting said first and second grounds in common.

17. The apparatus of claim 12 wherein said converter circuit means includes scaling means operable under program control for scaling said measurement signal, includes a fullwave rectifier for rectifying the scaled measurement signal and includes an analog-to-digital converter for converting the scaled and rectified measurement signal to a digital value.

18. The apparatus of claim 1 including register means, accessible under program control by said processor means, for storing information relating to the current test being performed by the measurement unit means.

19. The apparatus of claim 18 including selection means for selecting an output from either said register means or from said measurement unit means to provide a data input to said processor means.

20. The apparatus of claim 19 including flag store means accessible under program control by said processor means for storing a flag bit to signify when an output from said measurement unit means does or does not fall within limits stored by said processor means.

21. An apparatus for the in-circuit measuring of electrical properties of components connected in an electrical circuit comprising,

program commanded connection means for making electrical connection to nodes of a selected component,

program commanded exciter means for providing a selected excitation signal,

program commanded computing means connected to said selected component and responsive to said excitation signal to provide a measurement signal,

program commanded converter means responsive to said measurement signal to provide an output proportional to the electrical property being measured,

processor means for processing stored instructions for commanding said connection, exciter, computing and converter means;

said processor means operable during the execution of said instructions to call subroutines for commanding said computing means and said converter means as a function of the type of electrical property under test for said selected component.

22. A tester apparatus for testing for shorts in a circuit under test formed by a plurality of components interconnected at N nodes comprising,

a plurality of selectable connection switches having switch outputs for connection to selected nodes of the circuit under test, said connection switches including a first connection switch having means for selecting one of said N nodes as a first one of said switch outputs, and including a second connection switch having means for selecting (N-P-1) of said N nodes in common as a second one of said switch outputs where P is an integer less than N,

connection switch controller means for controlling said connection switches to connect said switch outputs to said selected nodes,

controllable measurement unit means connected to receive said switch outputs for measuring the resistance between said first one and said second one of said switch outputs as shorts tests,

measurement unit controller means for controlling said measurement unit means to perform said shorts test,

program controlled processor means for processing a program of instructions, including a shorts subroutine for commanding a shorts tests, said processor connected to said connection switch controller to cause said switch outputs to be connected to said selected nodes and said processor connected to said measuring unit controller for controlling said measurement unit to perform said shorts test in accordance with said shorts subroutine.

23. In a testing apparatus for the in-circuit measuring of electrical properties of components connected in an electrical circuit, the method comprising the steps of,

connecting, under program command, nodes of a selected component to a measurement unit,

exciting, under program command, said selected component and said measurement unit to provide a measurement signal unique to an electrical property of said selected component,

converting, under program command, said measurement signal to provide an output signal proportional to the electrical property being measured,

processing stored instructions for commanding said connecting step, said exciting step, and said converting step;

said processing including the execution of a subroutine as a function of the type of electrical property being measured for said selected component,

repeating said connecting step, said exciting step, said converting step and said processing step for a number of selected components in said electrical circuit.

24. In the method of claim 23, the additional step of connecting selected nodes of said circuit in common to isolate components from said selected component during said exciting and said converting steps.

25. A testing apparatus for testing electrical properties of an electrical circuit formed by a plurality of components interconnected at nodes comprising,

a program controllable in-circuit tester including selectable connection switches having switch outputs for connecting selected nodes of a selected component of said circuit to a program controllable measurement unit operable to measure electrical properties of said selected component,

a program controllable functional tester including selectable signal sources for providing excitation signals to said circuit to produce measurement signals;

including selectable measuring devices for measuring said measurement signals and including switch means for connecting selected ones of said signal sources and said measuring devices to said circuit,

program controllable transfer switch means for connecting selected ones of said switch outputs in said in-circuit tester to said switch means in said functional tester whereby said in-circuit tester and said functional tester are interactively connected for concurrent operation,

processor means for processing instructions for controlling said in-circuit tester, said functional tester and said transfer switch means.