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Programmable tester

  • US 3,931,506 A
  • Filed: 12/30/1974
  • Issued: 01/06/1976
  • Est. Priority Date: 12/30/1974
  • Status: Expired due to Term
First Claim
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1. A testing apparatus for testing electrical properties of a circuit under test formed by a plurality of components interconnected at nodes comprising,a plurality of selectable connection switches having switch outputs for connection to selected nodes of the circuit under test,connection switch controller means for controlling said connection switches to connect said switch outputs to said selected nodes,controllable measurement unit means connected to receive said switch outputs for measuring electrical properties of the circuit under test with predetermined tests,measurement unit controller means for controlling said measurement unit means to perform predetermined tests,program controlled processor means for processing a program of instructions, including subroutines of instructions correlated to predetermined tests in said measurement unit, said processor connected to said connection switch controller to cause said switch outputs to be connected to said selected nodes and said processor connected to said measuring unit controller for controlling said measurement unit to perform a selected one of the predetermined tests in accordance with a correlated subroutine.

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