Electro-optical method for measuring gaps and lines

• US 3,937,580 A
• Filed: 07/11/1974
• Issued: 02/10/1976
• Est. Priority Date: 07/11/1974
• Status: Expired due to Term

• Current Assignee: Recognition Systems Inc
• Original Assignee: Recognition Systems Inc
• Inventors: Kasdan, Harvey Lee
• Primary Examiner(s): Smith, Alfred E.
• Assistant Examiner(s): Rosenberger, Richard A.
• Application Number:
  US05/487,588
• Time in Patent Office: 579 Days
• Field of Search: 350/162 SF, 356/156, 356/109, 356/111, 356/199, 356/200, 356/238, 250/550, 250/559, 250/560, 250/571
• US Class Current: 356/635
• CPC Class Codes: G01B 11/024 by means of diode-array scanning
• CPC Class Codes: G01B 11/14 for measuring distance or clearance between spaced objects or spaced apertures G01B11/26 takes precedence; rangefinders G01C3/00
• CPC Class Codes: G05B 2219/37397 Measuring gap between tool and workpiece

Abstract

Rather than counting nulls in the diffraction pattern generated by a very narrow line or gap in order to measure its width, the diffraction pattern is optically detected and converted to an analog electrical signal constituting a function of the detected intensities in the diffraction pattern. This function is then converted to a digital form, stored, and then passed to a computer electrically computing the Fourier transform to provide an autocorrelation wave form. This wave form is then plotted in an orthogonal X-Y coordinate system and the break point or extension of a linear segment of the autocorrelation curve relative to the X-axis used to provide a precise measurement of the given width.

Claims

1. A method of measuring a given width, W of a line in an aperture comprising the steps of:

a. radiating the aperture with coherent light to cause generation of a diffraction pattern by said given width;

b. detecting said diffraction pattern to provide an analog electrical function;

c. converting said function to a digital form;

d. computing the Fourier transform of said digital form to provide an autocorrelation wave form;

e. plotting the autocorrelation wave form on an orthagonal X-Y coordinate system; and

f. measuring at least one point position determined by a linear segment in the autocorrelation wave form on an axis of said coordinate system to thereby provide a precise measure of said given width, said line being spaced from the left side of said aperture as viewed from the light source by a distance Wa and from the right side of the aperture by a distance Wb, and wherein;

g. if Wa>

Wb>

W then said linear segment constitutes the initial linear segment of said autocorrelation wave form and said point position corresponds to the first break point in said wave form occurring at the end of said initial linear segment;

h. if Wb>

W>

Wa then said linear segment constitutes the second linear segment, and said point position corresponds to the second break point in said wave form occurring at the end of said second linear segment; and

i. if W>

Wa>

Wb then said linear segment constitutes the third linear segment, and said point position corresponds to the third break point in said wave form occurring at the end of said third linear segment.