Leakage and continuity tester

• US 3,963,981 A
• Filed: 10/09/1974
• Issued: 06/15/1976
• Est. Priority Date: 10/09/1974
• Status: Expired due to Term

• Current Assignee: J M Richards Laboratories
• Original Assignee: J M Richards Laboratories
• Inventors: Vis, Vincent A.
• Primary Examiner(s): Mullins, James B.
• Application Number:
  US05/513,222
• Time in Patent Office: 615 Days
• Field of Search: 324/51, 324/62, 324/1, 317/18 A, 317/18 B, 340/255
• US Class Current: 324/510
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58

Abstract

A leakage and continuity test unit for checking the ground impedance and leakage current in a medical instrument to ensure that the medical instrument is properly grounded and does not conduct an excessive amount of leakage current through the chassis. The unit includes a test probe which is interconnected with the equipment under test, the unit including a continuity circuit having a comparator which compares a fixed voltage with a voltage representative of the impedance to ground of the equipment under test. The output of the comparator is fed to a flip flop circuit which, when an excessive amount of ground impedance exists, drives a warning lamp circuit. If the impedance is below certain set limits, the flip flop will drive a lamp which indicates that the ground of the equipment under test is proper. The unit also includes a leakage detector circuit which includes an upper and lower limit control circuit which establishes different standards for the equipment under test depending on whether the equipment is to be used in critical service or general service areas within the hospital. The leakage signal is fed through a precision rectifier which in turn feeds the signal to a dual input comparator which dual input comparator is capable of testing either a positive or negative signal. The output of the comparator is fed to a flip flop circuit which drives a set of lamps, one of which warns the user that an excess of leakage current exists and the other of which indicates to the user that the leakage current is within the limit set by the gain control circuit.

Claims

1. A test unit for testing the ground continuity and leakage characteristics of an electrical unit under test having a ground circuit and a chassis comprising a housing, means mounted on said housing adapted to be connected to the ground circuit of the unit under test, means adapted to be connected to the chassis, ground continuity test circuit means connected to said chassis connection means including a power supply and a conductor connected to said chassis for supplying electrical current though said chassis to said ground circuit to establish an electrical potential signal across the impedance of said ground circuit, said continuity test circuit means including comparator circuit means including an input signal from said chassis connection means and a fixed input signal, a go-no go type ground output indicator circuit including digital output means to indicate the acceptable or defective condition of said ground circuit as determined by said comparator circuit, and leakage current test means including input circuit means connected to the leakage current circuit under test including dual comparator means for comparing positive and negative polarity leakage signals with a standard signal, said input circuit means including an operational amplifier connected as a precision rectifier to sense positive and negative polarity input signals, and go-no go leakage output indicator circuit including digital output means to indicate the acceptable or defective condition of said leakage circuit as determined by said dual comparator circuit.

2. The improvement of claim 1 further including bi-stable circuit means connected between said comparator circuit and said ground output indicator circuit, said bi-stable circuit means having first and second stable states.

3. The improvement of claim 2 wherein said bi-stable circuit is in said first state in response to the input signal from said chassis being less than said fixed input signal and said second state in response to said input signal exceeding said fixed input signal.

4. The improvement of claim 3 further including a second bi-stable circuit connected between said dual input comparator circuit and said leakage output indicator circuit.

5. The improvement of claim 4 wherein said second bi-stable circuit has two stable states, said bi-stable circuit being in a first state in response to said leakage signal being less than said standard signal and being in a second state in response to said leakage signal exceeding said standard signal.

6. The improvement of claim 5 further including an a.c. power supply and wherein said a.c. power supply establishes a current flow through said chassis and at least a portion of said leakage current input circuit means.

7. The improvement of claim 6 wherein said means mounted on said housing is also connected to ground thereby connecting the ground circuit of the unit under test to a common ground with said test unit.

8. The improvement of claim 7 wherein said input circuit means includes impedance means connected between a common ground and said dual comparator means.

9. The improvement of claim 8 further including bias control circuit means connected between said impedance means and said dual comparator means for selectively varying said positive and negative polarity leakage signals in accordance with a variation in acceptable leakage currents for said unit under test.

10. The improvement of claim 9 wherein said go and no-go output indicator circuits include at least one lamp for each go circuit and at least on lamp for each no-go circuit, said go lamp being illuminated in response to said bi-stable circuit being in said first state and said no-go lamp being illuminated in response to said bi-stable circuit being in said second state.

11. The improvement of claim 10 wherein said dual comparator circuit means includes a first operational amplifier and a second operational amplifier, each of said amplifiers receiving one polarity leakage signal from said input circuit.

12. The improvement of claim 11 wherein said input rectifier circuit means includes a first input connected to said control bias circuit, said rectifier circuit including first and second storage means connected to the output of said operational amplifier for storing opposite polarity signal levels.

13. The improvement of claim 12 further including test circuit means connected to another input from said rectifier circuit operational amplifier including a test switch, said test switch being adapted to connect a signal level to said another input circuit for testing said go and no-go lamps.

14. The improvement of claim 13 wherein said test switch is a three-position center biased switch, movement of said switch from one direction off center illuminating said go lamp and moving said test switch in the opposite direction off center illuminating said no-go lamp.

15. The improvement of claim 14 further including ground continuity test circuit means including first and second impedance means, said chassis connecting means including a probe connected between the continuity test circuit means comparator circuit means and said chassis, said probe adapted to be selectively connected to said first and second impedance means, said first impedance means establishing a signal level for said comparator circuit means to illuminate said go lamp and said secod impedance means establishing a signal level to illuminate said no-go lamp.

16. The improvement of claim 1 further including an a.c. power supply and wherein said a.c. power supply establishes a current flow through said chassis, and at least a portion of said leakage current input circuit means.

17. The improvement of claim 16 wherein said means mounted on said housing is also connected to ground thereby connecting the ground circuit of the unit under test to a common ground with said test unit.

18. The improvement of claim 17 wherein said input circuit means includes impedance means connected between a common ground and said dual comparator means.

19. The improvement of claim 18 further including bias control circuit means connected between said impedance means and said dual comparator means for selectively varying said positive and negative polarity leakage signals in accordance with a variation in acceptable leakage current for said unit under test.