Spectrofluorimeter

• US 3,975,098 A
• Filed: 08/05/1975
• Issued: 08/17/1976
• Est. Priority Date: 08/05/1975
• Status: Expired due to Term

• Current Assignee: Applied Photophysics Ltd.
• Original Assignee: Applied Photophysics Ltd.
• Inventors: West, Michael Anthony
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US05/602,050
• Time in Patent Office: 378 Days
• Field of Search: 356/85, 356/97, 356/98, 250/361, 250/363, 250/364, 250/365, 250/458, 250/459, 250/461
• US Class Current: 356/318
• CPC Class Codes: G01J 3/4406 Fluorescence spectrometry

Abstract

A spectrofluorimeter for measuring excitation and emission spectra uses a flash or pulsed light source, an excitation monochrometer adjustable by a stepping motor, a first optical system for directing radiation onto a sample under test, a reference light detector for monitoring the excitation radiation, an emission monochrometer, also adjustable by a stepping motor, for receiving radiation via a second optical system from the sample and directing selected wavelengths to a detection photomultiplier, the first and second optical systems being corrected for spherical and chromatic alterations.

Claims

1. A spectrofluorimeter for detecting intensity of luminescence at various wavelengths emitted by a sample under test, which comprises a sample station whereat a sample may be located at a predetermined location, a flash or pulsed source of light, including a plasma discharge lamp, arranged to produce exciting radiation over a continuous range of wavelengths and emit radiation with intermittent intensity peaks at a desired frequency, an excitation monochromator located between the source and the sample station for transmitting radiation at a selected wavelength towards the sample, a first optical system arranged to focus light from the excitation monochromator at the sample station, means located in the radiation path between the excitation monochromator and the sample station to direct a reference beam of radiation to a reference radiation detector and thereby provide a correction signal for fluctuations in light intensity from the source, an emission monochromator arranged to receive luminescence from the sample under test via a second optical system and transmit radiation at a selected wavelength towards a detection system, stepping motors coupled to respective monochromators for varying the wavelength of radiation transmitted by the monochromators, the detection system including a photomultiplier responsive to the radiation transmitted by the emission monochromator and arranged to provide a signal dependent on the intensity of luminescence at the wavelength transmitted by the emission monochromator, and the first and second optical systems being corrected for spherical and chromatic aberrations.

2. A spectrofluorimeter according to claim 1 wherein the first and second optical systems comprise spherical or elliptical mirrors and thereby avoid the use of lenses.

3. A spectrofluorimeter according to claim 1 wherein the detection system includes a lock-in amplifier arranged to detect signals from the photomultiplier only at the said desired frequency at which light is emitted from the light source.

4. A spectrofluorimeter according to claim 1 wherein the detection system includes a box car detector arranged to detect signals from the photomultiplier only at the said desired frequency at which light is emitted from the light source.

5. A spectrofluorimeter according to claim 1 wherein the detection system includes a photon counting system.

6. A spectrofluorimeter according to claim 1 wherein the reference radiation detector comprises a photomultiplier arranged to receive an intermittent signal from the radiation beam directed towards the sample station.

7. A spectrofluorimeter according to claim 6 wherein the reference photomultiplier is arranged to compensate for variations in intensity of the excitation beam with wavelength as well as time.

8. A spectrofluorimeter according to claim 7 wherein the reference photomultiplier includes a wavelength converter in the radiation path leading to the reference photomultiplier so that as the wavelength of radiation directed towards the sample is changed, the wavelength converter converts the radiation to a fixed wavelength or spectrum so that the reference photomultiplier always receives radiation of the same wavelength.

9. A spectrofluorimeter according to claim 1 wherein the means located between the excitation monochromator and the sample station to direct radiation to the reference radiation detector comprises a reflecting device arranged to provide intermittent reflection to the reference photomultiplier.

10. A spectrofluorimeter according to claim 1 wherein the sample station is located in a housing having access over more than one side of the housing.

11. A spectrofluorimeter according to claim 10 wherein the housing is arranged to project at one edge or side of the spectrofluorimeter so that access to the housing is provided on three sides.