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Transistor testing circuit

  • US 3,979,672 A
  • Filed: 09/12/1975
  • Issued: 09/07/1976
  • Est. Priority Date: 09/12/1975
  • Status: Expired due to Term
First Claim
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1. A test circuit for a bipolar transistor, said transistor having collector and emitter electrodes defining a conduction path therebetween and a control electrode comprising, in combination:

  • energy storage means connected in series with said path to form a series circuit;

    means for applying successively larger currents to said series circuit;

    means for applying a forward bias to said control electrode while applying said successively larger currents;

    means, after each application of a current to said series circuit, for concurrently interrupting the flow of said current and changing the bias applied to said control electrode from a forward to a reverse bias;

    means responsive to the voltage across said energy storage means when said current is interrupted for providing a low impedance path across said series circuit in a direction to permit current flow from said energy storage means through said conduction path and said low impedance path back to said energy storage means; and

    means for indicating a rapid decrease in the voltage between the collector and emitter electrodes of said transistor while said reverse bias is present.

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