Two channel test instrument with active electronicphase shift means

• US 3,986,113 A
• Filed: 09/12/1974
• Issued: 10/12/1976
• Est. Priority Date: 11/23/1973
• Status: Expired due to Term

• Current Assignee: Hewlett-Packard Company (HP Inc.)
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Vifian, Hugo
• Primary Examiner(s): Segal, Robert
• Assistant Examiner(s): Tokar, Michael J.
• Application Number:
  US05/505,291
• Time in Patent Office: 761 Days
• Field of Search: 324/57 H, 324/57 R, 324/58 A, 324/58 B, 324/58 R, 324/79, 324/140, 324/85, 324/95, 324/58.5 A, 331/24, 331/25, 331/18, 328/133, 328/134, 328/155, 307/232, 307/233, 307/295, 307/262, 333/29
• US Class Current: 324/85
• CPC Class Codes: G01R 25/00 Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
• CPC Class Codes: G01R 27/28 Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in line transmission systems H04B3/46

Abstract

A network analyzer is provided with an electronically variable phase shifter in the IF portion of the reference channel, and the phase shifter is connected to sweeping signal generator (sweeper) driving the device under test. As the output frequency of the sweeper changes, the control signal to the phase shifter changes the phase shift in the IF portion of the reference channel, compensating for phase differences between the test and reference signals due to different line lengths in the two signal paths. The electronically variable phase shifter may comprise a linear phase shifter such as a phase lock loop along with a frequency mulitplier and down converter to multiply the phase shift produced by the phase shifter.

Claims

1. A two channel, a.c. test instrument comprising:

a first signal channel for carrying a first test signal and including a first frequency converter for converting the first test signal to an intermediate frequency;

a second signal channel for carrying a second test signal and including a second frequency converter for phase coherently converting the second test signal to the same intermediate frequency;

measurement means for measuring the relative values of the converted first and second test signals; and

electronic phase shift means connected in series with the second signal channel between the second frequency converter and the measurement means for shifting the phase of the converted second test signal as a function of the frequency of the second test signal.

2. A two-channel test instrument as in claim 1 wherein the electronic phase shift means comprises:

input means connected to receive the converted second test signal;

a first signal circuit for providing a first signal having a first frequency;

a second signal circuit for providing a second signal having a second frequency;

phase control means connected to receive the first and second signals for making the first and second frequencies equal and for controlling the relative phase of the first and second signals;

first circuit means connected to the first signal circuit for producing a third signal having a third frequency that is a multiple of the first frequency;

second circuit means connected to the second signal circuit and the input means for producing a fourth signal having a fourth frequency which is a multiple of the first frequency plus or minus the frequency of the second test signal with the third and fourth frequencies differing by the frequency of the second test signal; and

heterodyne converter means connected to the first and second circuit means for producing a shifted second test signal equal in frequency to the second test signal and shifted in phase with respect to the second test signal.

3. A two channel test instrument as in claim 2 wherein:

the first and second signal circuits comprise first and second frequency dividers;

the first circuit means comprises a first oscillator having an output connected to the first frequency divider;

the second circuit means comprises a second oscillator having a signal output connected to the second frequency divider and having a control input, and a first mixer having an output, having a first input connected to the second oscillator signal output and having a second input connected to the input means;

the phase control means comprises a phase detector having a first and second input connected respectively to the first and second frequency dividers and having an output, and a control amplifier having an input connected to the phase detector output and having an output connected to the second oscillator control input; and

the heterodyne converter means comprises a second mixer having a first input connected to the output of the first oscillator, having a second input connected to the output of the first mixer and an output, and having a filter connected to the output of the second mixer.

4. A two channel test instrument as in claim 3 further comprising a phase control signal source having an output for producing a phase control signal indicative of the frequency of the second test signal wherein the phase control signal source output is connected to the control amplifier for varying the relative phase between the first and second signals as a function of the phase control signal, thus varying the phase between the shifted and unshifted converted second test signals in response to changes in the frequency of the second test signal.

5. A two channel test instrument as in claim 4 including a variable frequency a.c. signal generator for supplying the second test signal wherein the signal generator includes the phase control signal source.

6. A two channel test instrument as in claim 4 wherein:

the measurement means produces a phase signal indicative of the phase between the converted first test signal and the shifted second test signal; and

the phase control means is connected to receive the phase signal for controlling the phase shift produced by the electronic phase shift means as a function of the phase between the first and second test signals.

7. A two channel test instrument as in claim 2 wherein:

the first signal circuit comprises an oscillator having a signal output and a control input;

the second signal circuit connects the input means to the phase control means;

the phase control means comprises a phase detector having a first input connected to the input means by the second signal circuit, having a second input connected to the signal output of the oscillator and having an output, a control amplifier having an input connected to the output of the phase detector and having an output connected to the control input of the oscillator;

the first circuit means comprises a first frequency multiplier having an input connected to the signal output of the oscillator and having an output connected to the heterodyne converter means;

the second circuit means comprises a second frequency multiplier having an input connected to the input means by the second signal circuit and having an output connected to the heterodyne converter means; and

the heterodyne converter means comprises a mixer having first and second inputs connected respectively to the first and second frequency multipliers and having an output, and a filter connected to the mixer output.

8. A two channel test instrument as in claim 7 further comprising a phase control signal source having an output for producing a phase control signal indicative of the frequency of the second test signal wherein the phase control signal source output is connected to the control amplifier for varying the relative phase between the first and second signals as a function of the phase control signal, thus varying the phase between the shifted and unshifted converted second test signals in response to changes in the frequency of the second test signal.

9. A two channel test instrument as in claim 8 including a variable frequency a.c. signal generator for supplying the second test signal wherein the signal generator includes the phase control signal source.