Process and apparatus for locating short-circuits in multi-layer circuit boards
First Claim
1. A device for detecting short circuits on multiconductor stacked boards comprising, an alternating source comprising a sine wave or pulse generator which has an output frequency of less than one kHz connected to a pair of said multiconductors which are intended to be insulated from each other, a magnetic head detector probe moveable over a surface of one of said stacked boards to detect the path of current flow between said pair of multiconductors, an alternating current amplifier connected to said magnetic probe, an indicator connected to said amplifier to indicate the flow of current between said pair of multiconductors such that the location of short circuits can be determined, and mechanical scanning means connected to said magnetic head detector probe for moving it longitudinally and laterally over a surface of said stacked boards.
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Abstract
Method and apparatus for locating shot-circuis in multi-layer circuit boards which comprise applying a detectable signal between conductors on the circuit boards which should be insulated from each other and utilizing a movable probe capable of detecting the detectable signal which exists between the conductors when a fault such as a short circuit exists between them. By moving the probe over various areas of the circuit boards, the particular physical location of the fault can be determined. The probe may be manually moved or moved with a scanning mechanism.
50 Citations
4 Claims
- 1. A device for detecting short circuits on multiconductor stacked boards comprising, an alternating source comprising a sine wave or pulse generator which has an output frequency of less than one kHz connected to a pair of said multiconductors which are intended to be insulated from each other, a magnetic head detector probe moveable over a surface of one of said stacked boards to detect the path of current flow between said pair of multiconductors, an alternating current amplifier connected to said magnetic probe, an indicator connected to said amplifier to indicate the flow of current between said pair of multiconductors such that the location of short circuits can be determined, and mechanical scanning means connected to said magnetic head detector probe for moving it longitudinally and laterally over a surface of said stacked boards.
Specification