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Method and apparatus for pattern analysis

  • US 3,993,976 A
  • Filed: 05/13/1974
  • Issued: 11/23/1976
  • Est. Priority Date: 05/13/1974
  • Status: Expired due to Term
First Claim
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1. Apparatus for analyzing a two dimensional pattern comprising,means for transforming the pattern into a spatial frequency domain to relate harmonically the elements forming the pattern information,means for filtering the transformed pattern substantially in accordance with the anisotropic attenuation characteristics of the human visual system, andmeans for bandpass filtering the filtered transform to extract spatial frequency subsets from the said filtered transform for feature analysis.

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