Method and apparatus for testing circuits

• US 4,002,974 A
• Filed: 11/13/1975
• Issued: 01/11/1977
• Est. Priority Date: 11/13/1975
• Status: Expired due to Term

• Current Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Original Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Inventors: Thomas, Edward Wherry
• Primary Examiner(s): Rolinec, R. V.
• Assistant Examiner(s): Sunderdick, Vincent J.
• Application Number:
  US05/631,731
• Time in Patent Office: 425 Days
• Field of Search: 324/73 R, 324/73 AT, 324/73 PC, 235/153 AC
• US Class Current: 714/735
• CPC Class Codes: G01R 31/3193 with comparison between actual response and known fault free response receiver details G01R31/31924

Abstract

Functional and parametric checks of a circuit to be tested are in effect conducted concurrently. Equivalent loads are connected to the circuit and the loads are programmable under control of a test system. In that way, various different fan-in and fan-out capabilities as well as other parameters of the circuit may be sequentially checked without disconnecting the system from the circuit and while functional testing is taking place.

Claims

1. Apparatus for testing an electrical device having multiple input and output terminals, the intended functional operation of said device being represented by a logical truth table or function table, said testing being intended to assure that the prescribed functional capabilities of the device as well as specified parameters of the device conform to design standards, said apparatus comprising

plural variable loads respectively connected to the input and output terminals of said device,

means for setting said loads to values corresponding to device parameters to be tested,

means for applying successive sets of fixed input and output signals to said device via said respective variable loads in accordance with said table,

means for providing reference signals,

and means connected to the input and output terminals of said device for comparing the actual signals appearing thereat with said reference signals and for providing an error indication in the event that the relative magnitudes of any corresponding pair of actual and reference signals deviates from a prescribed relationship.

2. Apparatus as in claim 1 wherein each of said variable loads comprises a resistor having one end connected to its respective input or output terminal and the other end connected to a voltage source.

3. Apparatus as in claim 2 wherein said comparing and providing means comprises a comparator unit and a pass-fail logic unit associated with each different one of said input and output terminals, said comparator unit being responsive to the actual signal appearing at its associated input or output terminal and to the corresponding reference signal for applying to said logic unit a signal indicative of the relative magnitudes of said actual and reference signals.

4. Apparatus as in claim 3 wherein said setting means is adapted to vary the value of each of said resistors.

5. Apparatus as in claim 3 wherein said setting means is adapted to vary the value of each of said voltage sources.

6. Apparatus for testing a multiple-input circuit whose intended functional operation is represented by a truth table or function table, said testing being intended to insure that the prescribed functional capabilities of the circuit as well as specified parameters of the circuit conform to design standards, said apparatus comprising

means for applying sets of signals to the respective inputs of said circuit to simulate input conditions represented by said truth table or function table,

means for providing a standard output signal representation for each set of applied input signals,

and means for comparing the actual output representation provided by said circuit in response to each set of applied input signals with the corresponding standard output signal representation,

characterized in that said apparatus also includes means connected to the inputs and outputs of said circuit to provide respective simulated loads therefor during the functional testing of said circuit so that parametric testing of said circuit is conducted during the functional testing thereof,

means for varying the values of the loads connected to said circuit so that different parametric tests may be conducted during functional testing,

and means for providing an error signal to indicate a failure of either said functional testing or said parametric testing.

7. A method for testing circuits of the type that include multiple input and output terminals, the intended functional operation of said circuit being represented by a logical truth table or function table, said testing being intended to assure that the prescribed functional capabilities of the circuit as well as specified parameters of the circuit conform to design standards, said method comprising the steps of

connecting plural variable loads to the respective input and ouput terminals of said circuit,

setting said loads to values corresponding to circuit parameters to be tested,

applying successive sets of fixed input and output signals to said circuit via said respective variable loads in accordance with said table,

comparing the actual signal appearing at each of said input and output terminals with a reference signal,

and generating an error indication in the event that the relative magnitudes of any corresponding pair of actual and reference signals deviates from a prescribed relationship.