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Wafer scale integration system

  • US 4,007,452 A
  • Filed: 07/28/1975
  • Issued: 02/08/1977
  • Est. Priority Date: 07/28/1975
  • Status: Expired due to Term
First Claim
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1. In a semiconductor wafer which includes a plurality of circuit units fabricated on said wafer and a first bus for communicating with said devices an improvement comprising:

  • a second bus disposed on said wafer for transmitting an identification signal to said units;

    circuit means disposed on said wafer and coupled to said second bus for selectively altering said identification signal along said second bus;

    whereby said circuit means may provide an identification signal to each useable circuit unit on said wafer.

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